Combined AFM and STM measurements of a silicene sheet grown on the Ag(111) surface

Journal of Physics Condensed Matter

Volumn 25, Issue 22, 2013, Pages

  Majzik, Z ^a   Rachid Tchalala, M ^b   Svec M ^a   Hapala, P ^a   Enriquez, H ^b   Kara, A ^c   Mayne, A J ^b   Dujardin, G ^b   Jelinek P ^a   Oughaddou, H ^b,d  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b INSTITUT DES SCIENCES MOLÉCULAIRES D ORSAY   (France)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

^d UNIVERSITÉ DE CERGY PONTOISE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AG(111) SURFACE; HONEYCOMB LAYERS; MEASUREMENTS OF; NONCONTACT ATOMIC FORCE MICROSCOPY; SILICENE; SILICON ATOMS; STM IMAGES;

ATOMIC FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

SILVER;

EID: 84878070997     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/25/22/225301     Document Type: Article

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