Silicon-induced faceting at the Ag(110) surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 89, Issue 11, 2014, Pages

  Ronci, Fabio ^a   Serrano, Giulia ^a   Gori, Paola ^a   Cricenti, Antonio ^a   Colonna, Stefano ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84898745819     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.89.115437     Document Type: Article

References (39)

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32. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.89.115437 for video S1, reporting six consecutive (Equation presented)-nm(Equation presented) constant current STM images ((Equation presented) V, (Equation presented) nA, (Equation presented) K, frame rate about 300 s).
33. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.89.115437 for video S2, reporting the LEED pattern evolution of the 490-K IC sample as a function of electron-beam energy from 30 to 70 eV and vice versa.
34. M. A. Hove, Low-energy Electron Diffraction: Experiment, Theory, and Surface Structure Determination (Springer-Verlag, Berlin, New York, 1986).
35. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.89.115437 for video S3, reporting the LEED pattern evolution of the 550-K IC sample as a function of electron-beam energy from 30 to 70 eV and vice versa.
36. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.89.115437 for the complete set of calculated models of the Ag(221) surface.
37. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.89.115437 for the the relative density calculations.
38. Since the experimental STM image was obtained on a (22(Equation presented)) facet, the simulated image reported in Fig. 3(c) results to be specularly reflected along the [(Equation presented)10] direction with respect to the one reported in Fig. 7(c).
39. See Supplemental Material at http://link.aps.org/supplemental/10.1103/ PhysRevB.89.115437 for Si surface density calculations.