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Volumn 46, Issue S1, 2014, Pages 54-57

Fundamental aspects of Arn + SIMS profiling of common organic semiconductors

Author keywords

Depth profiling; Ion yield; Matrix effect; OPV; P3HT; PCBM; PCDTBT; Sputter yield

Indexed keywords

FULLERENES; KINETIC ENERGY; KINETICS; ORGANIC SOLAR CELLS; PHYSICOCHEMICAL PROPERTIES; POLYMER BLENDS;

EID: 84912068847     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5621     Document Type: Conference Paper
Times cited : (12)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.