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Volumn 46, Issue S1, 2014, Pages 54-57
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Fundamental aspects of Arn + SIMS profiling of common organic semiconductors
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Author keywords
Depth profiling; Ion yield; Matrix effect; OPV; P3HT; PCBM; PCDTBT; Sputter yield
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Indexed keywords
FULLERENES;
KINETIC ENERGY;
KINETICS;
ORGANIC SOLAR CELLS;
PHYSICOCHEMICAL PROPERTIES;
POLYMER BLENDS;
ION YIELDS;
MATRIX EFFECTS;
P3HT;
PCBM;
PCDTBT;
SPUTTER YIELDS;
DEPTH PROFILING;
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EID: 84912068847
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.5621 Document Type: Conference Paper |
Times cited : (12)
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References (12)
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