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Materials Science in Semiconductor Processing

Volumn 28, Issue , 2014, Pages 54-58

Properties of cobalt-doped zinc oxide thin films grown by pulsed laser deposition on glass substrates

(7) Taabouche, Adel a,b Bouabellou, Abderrahmane a Kermiche, Fouad a Hanini, Faouzi a Bouachiba, Yacine a Grid, Azzeddine b Kerdjac, Tahar c

a Universite Mentouri Constantine (Algeria)

b Centre Recherche Scientifique et Technique en Soudage et Controle (Algeria)

c CENTRE DE DÉVELOPPEMENT DES TECHNOLOGIES AVANCÉES (Algeria)

Author keywords

Optical transmittance; Piezoelectric; Pulsed laser deposition; Thin films; Waveguiding properties; ZnO

Indexed keywords

COBALT; DEPOSITION; EXCIMER LASERS; GLASS; METALLIC FILMS; OPACITY; OPTICAL PROPERTIES; OXIDE FILMS; PIEZOELECTRICITY; PULSED LASER DEPOSITION; PULSED LASERS; REFRACTIVE INDEX; SEMICONDUCTOR DOPING; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILMS; WAVEGUIDES; X RAY DIFFRACTION; ZINC; ZINC OXIDE; ZINC SULFIDE;

DOPED ZINC OXIDE THIN FILMS; EXPERIMENTAL UNCERTAINTY; OPTICAL TRANSMITTANCE SPECTRUM; PIEZOELECTRIC; PIEZOELECTRIC THIN FILMS; TRANSVERSE ELECTRIC MODES; WAVEGUIDING PROPERTIES; ZNO;

OPTICAL FILMS;

EID: 84911375640 PISSN: 13698001 EISSN: None Source Type: Journal
DOI: 10.1016/j.mssp.2014.05.024 Document Type: Article

Times cited : (30)

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