Measuring low loss dielectric substrates with scanning probe microscopes

Applied Physics Letters

Volumn 105, Issue 1, 2014, Pages

  Hoffmann, Johannes ^a   Gramse, Georg ^b   Niegemann, Jens ^c   Zeier, Markus ^a   Kienberger, Ferry ^d  

^a METAS   (Switzerland)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^c ETH ZURICH   (Switzerland)

^d Agilent Technologies Osterrreich GmbH   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC SUBSTRATES; SCANNING PROBES;

EID: 84908519184     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4886965     Document Type: Article

References (12)

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