Calibration of shielded microwave probes using bulk dielectrics

Applied Physics Letters

Volumn 93, Issue 12, 2008, Pages

  Lai, K ^a   Kundhikanjana, W ^a   Kelly, M A ^a   Shen, Z X ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; ION BOMBARDMENT; MICROWAVES; PLATINUM; STRIP TELECOMMUNICATION LINES;

BULK MATERIALS; DIELECTRIC CONSTANTS; FINITE-ELEMENT ANALYSIS; MICROWAVE IMPEDANCE; MICROWAVE PROBING; NEAR FIELDS; STRAY FIELDS; STRIP LINE STRUCTURE; STRIP LINES;

DIELECTRIC MATERIALS;

EID: 52949083150     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2990638     Document Type: Article

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