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Volumn , Issue , 2013, Pages 88-97

Analyzing reliability of memory sub-systems with double-chipkill detect/correct

Author keywords

chipkill correct; error correcting codes; memory errors; modeling; reliability

Indexed keywords

ANALYTICAL MODELS; ERROR CORRECTION; MODELS; MONTE CARLO METHODS; RELIABILITY;

EID: 84906764050     PISSN: 15410110     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PRDC.2013.18     Document Type: Conference Paper
Times cited : (13)

References (18)
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  • 2
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  • 3
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    • Blaum, M.1    Goodman, R.2    McEliece, R.3
  • 4
    • 0020141452 scopus 로고
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    • vol. C-31
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  • 8
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    • Reliability analysis of memories suffering multiple bit upsets," Device and Materials Reliability
    • P. Reviriego, J. A. Maestro, and C. Cervantes, "Reliability analysis of memories suffering multiple bit upsets," Device and Materials Reliability, IEEE Transactions on, vol. 7, no. 4, pp. 592-601, 2007
    • (2007) IEEE Transactions on , vol.7 , Issue.4 , pp. 592-601
    • Reviriego, P.1    Maestro, J.A.2    Cervantes, C.3
  • 11
    • 63149109499 scopus 로고    scopus 로고
    • Reliability of single-error correction protected memories
    • J. A. Maestro and P. Reviriego, "Reliability of single-error correction protected memories," Reliability, IEEE Transactions on, vol. 58, no. 1, pp. 193-201, 2009
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    • Maestro, J.A.1    Reviriego, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.