Reliability of single-error correction protected memories

IEEE Transactions on Reliability

Volumn 58, Issue 1, 2009, Pages 193-201

  Maestro, Juan Antonio ^a   Reviriego, Pedro ^a  

^a UNIVERSIDAD ANTONIO DE NEBRIJA   (Spain)

Author keywords

Error correction codes; Memory; Reliability; Single event upsets (SEU)

Indexed keywords

DATA STORAGE EQUIPMENT; ELECTRIC NETWORK ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; QUALITY ASSURANCE; RELIABILITY ANALYSIS; SYSTEMS ENGINEERING; URANIUM POWDER METALLURGY;

CRITICAL FACTORS; DIRECT IMPACTS; ERROR CORRECTION CODES; MEAN TIME TO FAILURES; MEMORY; MEMORY SYSTEMS; PRECISE ANALYSIS; RADIATION ENVIRONMENTS; RELIABILITY MODELS; SINGLE EVENT UPSETS (SEU); SOFT ERRORS; SYSTEM FAILURES; TRADITIONAL TECHNIQUES; TRIPLE MODULAR REDUNDANCIES; VARIABLE PERIODS;

ERROR CORRECTION;

EID: 63149109499     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2008.2006470     Document Type: Article

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