Markov models of fault-tolerant memory systems under SEU

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn , Issue , 2004, Pages 38-43

  Schiano, Luca ^a   Ottavi, Marco ^a   Lombardi, Fabrizio ^a  

^a Northeastern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DUPLEX SYSTEMS; FAULT TOLERANT MEMORY SYSTEMS; MARKOV MODELS; SINGLE HIGH ENERGY PARTICLES;

CODING ERRORS; DATA STORAGE EQUIPMENT; ERROR CORRECTION; ERROR DETECTION; MARKOV PROCESSES; RELIABILITY THEORY;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 10044293121     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.2004.1327982     Document Type: Conference Paper

References (13)

1. A.H.Johnston, "Radiation effects in advanced microelectronics technologies", in IEEE Transactions on Nuclear Science, vol. 45(3), pp. 1339-1354, Jun.1998.
2. R.C.Baumann,"Soft Errors in Advanced Semiconductor Devices- Part I: The Tree Radiation Sources", in IEEE Trans. on Device and Materials Reliability, Vol.1(1), pp. 17-22, Mar.2001.
3. T.Karnik et al.,"Scaling Trends of Cosmic Rays induced Soft Errors in Static Latches beyond 0.18μ", in 2001 Symposium on VLSI Circuits Digest of Technical Papers, pp. 61-62, Jun.2001.
4. P.K.Lala, Self-Checking and Fault-Tolerant Digital Design, Morgan Haufmann Publisher, San Diego (CA), 2001.
5. J.F.Ziegler et al., "Cosmic Ray Soft Error Rates of 16-Mb DRAM Memory Chips", in IEEE Journal of Solid-State Circuits, Vol. 33, N. 2, Feb.1998.
6. G.C.Cardarilli, A.Leandri, P.Marinucci, M.Ottavi, S.Pontarelli, M.Re, A.Salsano, "Design of a Fault-Tolerant Solid State Mass Memory", in IEEE Trans. on Reliability, Vol.52(4), pp.476-491, Dec.2004.
7. K.S.Trivedi, Probability and Statistics with Reliability Queuing and Computer Science Applications, Wiley, 2002.
8. R.A.Sahner, K.S.Trivedi, A.Puliafito, Performance and Reliability Analysis of Computer Systems, Kluwer Academic Publisher, 1996.
9. R.W.Butler, "SURE Input Language", http:atb-www.larc.nasa. govrwbrel.html.
10. R.W.Butler, D.P.Boerschlein, "PAWS/STEM Program Exstension", http:atb-www.larc.nasa.govrwbrel.html.
11. A.M.Finn, "System Effects of Single Event Upsets", in Proc. of 7th Computers in Aerospace Conf., pp. 994-1002, Oct.1989.
12. N.H. Vaidya, "Comparison fo Duplex and Triplex Memory Reliability", in IEEE Trans. on Computers, Vol.45, pp. 503-507, Apr.1996.
13. N.H.Vaidya, D.K.Pradham, "Fault-tolerant Design Strategies for High Reliability and Safety," in IEEE Trans. on Computers, vol. 42, N. 10, Oct.1993.