Quantification of electromechanical coupling measured with piezoresponse force microscopy

Journal of Applied Physics

Volumn 116, Issue 6, 2014, Pages

  Lepadatu, Serban ^a   Stewart, Mark ^a   Cain, Markys G ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMECHANICAL COUPLING; LASER DOPPLER VELOCIMETERS; SCANNING PROBE MICROSCOPY;

DISPLACEMENT VALUE; ELECTRODE DIAMETERS; ELECTRODE STRUCTURE; EPITAXIAL FERROELECTRIC; FINITE ELEMENT SIMULATIONS; LASER DOPPLER VIBROMETRY; PIEZORESPONSE FORCE MICROSCOPY; SUBSTRATE BENDING;

ELECTRODES;

EID: 84906309080     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4891353     Document Type: Article

References (20)

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