Imaging mechanism of piezoresponse force microscopy in capacitor structures

Applied Physics Letters

Volumn 92, Issue 15, 2008, Pages

  Kalinin, Sergei V ^a   Rodriguez, Brian J ^a,f   Kim, Seung Hyun ^b   Hong, Suk Kyoung ^c   Gruverman, Alexei ^d   Eliseev, Eugene A ^e  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b INOSTEK Inc   (South Korea)

^c Hynix Semiconductor Inc   (South Korea)

^d UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^e FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^f MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN WALLS; ELECTRODES; POLARIZATION;

BILINEAR FUNCTION; PIEZORESPONSE FORCE MICROSCOPY;

CAPACITORS;

EID: 42349094823     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2905266     Document Type: Article

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