Methodology for achieving best trade-off of area and fault masking coverage in ATMR

LATW 2014 - 15th IEEE Latin-American Test Workshop

Volumn , Issue , 2014, Pages

  Gomes, Iuri A C ^a   Martins, Mayler ^a   Kastensmidt, Fernanda Lima ^a   Reis, Andre ^a   Ribas, Renato ^a   Novales, Sylvain P ^b  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^b Ecole Nationale Superieure d'Electronique Informatique et Radiocommunications de Bordeaux   (France)

Author keywords

Approximated circuit; TMR; Transient Faults

Indexed keywords

FAULT DETECTION; FAULT TOLERANT COMPUTER SYSTEMS;

APPROXIMATE FUNCTION; FAULT COVERAGES; FAULT INJECTION; MAJORITY VOTER; REDUNDANT MODULES; TMR; TRANSIENT FAULTS; TRIPLE MODULAR REDUNDANCY;

COST REDUCTION;

EID: 84904563123     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/LATW.2014.6841916     Document Type: Conference Paper

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