Analysis of SET propagation in Flash-based FPGAs by means of electrical pulse injection

IEEE Transactions on Nuclear Science

Volumn 57, Issue 4 PART 1, 2010, Pages 1820-1826

  Sterpone, L ^a   Battezzati, N ^a   Ferlet Cavrois, V ^b  

^a POLITECNICO DI TORINO   (Italy)

^b EUROPEAN SPACE AGENCY   (Spain)

Author keywords

Characterization; flash based FPGAs; single event transients (SETs)

Indexed keywords

BASIC LOGIC; CIRCUIT LOGIC; COMBINATIONAL LOGIC; CRITICAL BEHAVIOR; EFFECTIVE ANALYSIS; ELECTRICAL PULSE; EXPERIMENTAL ANALYSIS; FLASH-BASED FPGAS; LOGIC PATH; LOGIC RESOURCES; PLACE AND ROUTE; SET PROPAGATION; SINGLE EVENT EFFECTS; SINGLE EVENT TRANSIENTS; SINGLE EVENT TRANSIENTS (SETS); TECHNOLOGY SCALING;

DIGITAL INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; LOGIC CIRCUITS;

TRANSIENTS;

EID: 77955817641     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2010.2043686     Document Type: Conference Paper

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