Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

Applied Physics Letters

Volumn 101, Issue 15, 2012, Pages

  Tellez H ^a   Chater, R J ^a   Fearn, S ^a   Symianakis, E ^a   Brongersma, H H ^a,b   Kilner, J A ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER NEUTRALIZATION; CHARGE EXCHANGES; DOMINANT MECHANISM; ION FRACTION; LOW-ENERGY ION SCATTERING; REIONIZATION; SENSITIVITY FACTORS; SURFACE DENSITY;

ISOTOPES;

SILICA;

EID: 84867534505     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4758699     Document Type: Article

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