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Volumn 104, Issue 23, 2014, Pages

Mechanical anomaly impact on metal-oxide-semiconductor capacitors on flexible silicon fabric

Author keywords

[No Author keywords available]

Indexed keywords

BENDING TESTS; CAPACITORS; DIELECTRIC DEVICES; ELECTRIC BREAKDOWN; SILICON;

EID: 84902504002     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4882647     Document Type: Article
Times cited : (30)

References (26)
  • 9
    • 34547816749 scopus 로고    scopus 로고
    • 10.1002/adma.200602223
    • Y. Sun and J. A. Rogers, Adv. Mater. 19 (15), 1897-1916 (2007). 10.1002/adma.200602223
    • (2007) Adv. Mater. , vol.19 , Issue.15 , pp. 1897-1916
    • Sun, Y.1    Rogers, J.A.2
  • 18
    • 84872111074 scopus 로고    scopus 로고
    • 10.1021/nl304310x
    • D. Shahrjerdi and S. W. Bedell, Nano Lett. 13 (1), 315-320 (2012). 10.1021/nl304310x
    • (2012) Nano Lett. , vol.13 , Issue.1 , pp. 315-320
    • Shahrjerdi, D.1    Bedell, S.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.