Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy

Optics Express

Volumn 17, Issue 16, 2009, Pages 13541-13553

  Huang, Xiaojing ^a   Miao, Huijie ^a   Steinbrener, Jan ^a   Nelson, Johanna ^a   Shapiro, David ^b   Stewart, Andrew ^a   Turner, Joshua ^a   Jacobsen, Chris ^a  

^a STONY BROOK UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EFFICIENCY; LIGHT; X RAY DIFFRACTION; X RAY MICROSCOPES;

BRIGHTFIELD IMAGING; COHERENT DIFFRACTION; DIFFRACTION SIGNALS; NUMERICAL APERTURE; RADIATION EXPOSURE; SIGNAL TO NOISE RATIO ESTIMATION; TRANSMISSION X-RAYS; X-RAY DIFFRACTION MICROSCOPY;

SIGNAL TO NOISE RATIO;

ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; METHODOLOGY; MICROSCOPY; RADIATION DOSE; RADIOMETRY; SENSITIVITY AND SPECIFICITY; X RAY DIFFRACTION;

ARTIFACTS; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; RADIATION DOSAGE; RADIOMETRY; SENSITIVITY AND SPECIFICITY; X-RAY DIFFRACTION;

EID: 68449091494     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.013541     Document Type: Article

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