Drift correction in ptychographic diffractive imaging

Ultramicroscopy

Volumn 126, Issue , 2013, Pages 44-47

  Beckers, Mike ^a   Senkbeil, Tobias ^a,b   Gorniak, Thomas ^a,b   Giewekemeyer, Klaus ^d   Salditt, Tim ^d   Rosenhahn, Axel ^a,b,c  

^a UNIVERSITY OF HEIDELBERG   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c RUHR UNIVERSITY BOCHUM   (Germany)

^d UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Drift correction; Ptychography; X Ray microscopy

Indexed keywords

COHERENT DIFFRACTIVE IMAGING; DATA COLLECTION; DIFFRACTIVE IMAGING; DRIFT CORRECTION; MECHANICAL DRIFT; PHASE RETRIEVAL; POSITIONAL ACCURACY; PTYCHOGRAPHY; RECONSTRUCTION QUALITY; SIEMENS STARS; X RAY MICROSCOPY;

MOLECULAR PHYSICS;

MICROSCOPIC EXAMINATION;

ALGORITHM; ARTICLE; ARTIFACT REDUCTION; DRIFT CORRECTION; IMAGE QUALITY; IMAGE RECONSTRUCTION; LINEAR DRIFT MODEL; MATHEMATICAL MODEL; MATHEMATICAL PARAMETERS; PROCESS OPTIMIZATION; PTYCHOGRAPHIC DIFFRACTIVE IMAGING; RADIOGRAPHY; SOFT X RAY; SUMMED SQUARE ERROR; X RAY;

EID: 84873538152     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.11.006     Document Type: Article

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