Field-effect passivation and degradation analyzed with photoconductance decay measurements

Applied Physics Letters

Volumn 104, Issue 19, 2014, Pages

  Chen, Yi Yang ^a   Hsin, Pi Yu ^a   Leendertz, Caspar ^b   Korte, Lars ^b   Rech, Bernd ^b   Du, Chen Hsu ^c   Gan, Jon Yiew ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b HAHN MEITNER INSTITUT   (Germany)

^c INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS;

DECAY MEASUREMENTS; DIELECTRIC CHARGE; FIELD-EFFECT; PHOTOCONDUCTANCE; SURFACE PASSIVATION; SURFACE RECOMBINATION VELOCITIES;

PASSIVATION;

EID: 84900854451     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4876126     Document Type: Article

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