Fabrication of a single layer graphene by copper intercalation on a SiC(0001) surface

Applied Physics Letters

Volumn 104, Issue 5, 2014, Pages

  Yagyu, Kazuma ^a   Tajiri, Takayuki ^a   Kohno, Atsushi ^a   Takahashi, Kazutoshi ^b   Tochihara, Hiroshi ^a   Tomokage, Hajime ^a   Suzuki, Takayuki ^a  

^a FUKUOKA UNIVERSITY   (Japan)

^b SAGA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; COPPER METALLOGRAPHY; DOPING (ADDITIVES); PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON; SILICON CARBIDE; SILICON COMPOUNDS;

CHARACTERISTIC PEAKS; COPPER INTERCALATION; CORE-LEVEL SPECTRA; GRAPHENE LATTICES; LINEAR DISPERSION; SIC SUBSTRATES; SINGLE LAYER; THERMAL-ANNEALING;

GRAPHENE;

EID: 84899809343     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4864155     Document Type: Article

References (21)

1. A. K. Geim and K. S. Novoselov, Nature Mater. 6, 183 (2007). 10.1038/nmat1849
2. K. S. Novoselov, D. Jiang, F. Schedin, T. J. Booth, V. V. Khotkevich, S. V. Morozov, and A. K. Geim, Proc. Natl. Acad. Sci. U.S.A. 102, 10451 (2005). 10.1073/pnas.0502848102
3. H. Hibino, H. Kageshima, F. Maeda, M. Nagase, Y. Kobayashi, and H. Yamaguchi, Phys. Rev. B 77, 075413 (2008). 10.1103/PhysRevB.77.075413
4. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A. Firsov, Science 306, 666 (2004). 10.1126/science.1102896
5. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, M. I. Katsnelson, I. V. Grigorieva, S. V. Dubonos, and A. A. Firsov, Nature 438, 197 (2005). 10.1038/nature04233
6. P. W. Sutter, J.-I. Flege, and E. A. Sutter, Nature Mater. 7, 406 (2008). 10.1038/nmat2166
7. H. C. Schniepp, J.-L. Li, M. J. McAllister, H. Sai, M. Herrera-Alonso, D. H. Adamson, R. K. Prund'homme, R. Car, D. A. Saville, and I. A. Aksay, J. Phys. Chem. B 110, 8535 (2006). 10.1021/jp060936f
8. S. Park, J. An, I. Jung, R. D. Piner, S. J. An, X. Li, A. Velamakanni, and R. S. Ruoff, Nano Lett. 9, 1593 (2009). 10.1021/nl803798y
9. U. Starke and C. Riedl, J. Phys.: Condens. Matter 21, 134016 (2009). 10.1088/0953-8984/21/13/134016
10. H. Hibino, H. Kageshima, and M. Nagase, NTT Tech. Rev. 8, 1 (2010);
11. H. Hibino, H. Kageshima, and M. Nagase, J. Phys. D: Appl. Phys. 43, 374005 (2010). 10.1088/0022-3727/43/37/374005
12. C. Riedl, C. Coletti, T. Iwasaki, A. A. Zakharov, and U. Starke, Phys. Rev. Lett. 103, 246804 (2009). 10.1103/PhysRevLett.103.246804
13. C. Riedl, C. Coletti, and U. Starke, J. Phys. D 43, 374009 (2010). 10.1088/0022-3727/43/37/374009
14. B. Premlal, M. Cranney, F. Vonau, D. Aubel, D. Casterman, M. M. De Souza, and L. Simon, Appl. Phys. Lett. 94, 263115 (2009). 10.1063/1.3168502
15. I. Gierz, T. Suzuki, R. T. Weitz, D. S. Lee, B. Krauss, C. Riedl, U. Starke, H. Höchst, J. H. Smet, C. R. Ast, and K. Kern, Phys. Rev. B 81, 235408 (2010). 10.1103/PhysRevB.81.235408
16. K. Takahashi, Y. Kondo, J. Azuma, and M. Kamada, J. Electron Spectrosc. Relat. Phenom. 144-147, 1093 (2005). 10.1016/j.elspec.2005.01.184
17. L. Zhao, K. T. Rim, H. Zhou, R. He, T. F. Heinz, A. Pinczuk, G. W. Flynn, and A. N. Pasupathy, Solid State Commun. 151, 509 (2011). 10.1016/j.ssc.2011. 01.014
18. W. Kim, K. Yoo, E. K. Seo, S. J. Kim, and C. Hwang, J. Korean Phys. Soc. 59, 71 (2011). 10.3938/jkps.59.71
19. X. Chen, S. Liu, L. Liu, X. Liu, X. Liu, and L. Wang, Appl. Phys. Lett. 100, 163106 (2012). 10.1063/1.4704149
20. T. Niu, M. Zhou, J. Zhang, Y. Feng, and W. Chen, J. Am. Chem. Soc. 135, 8409 (2013). 10.1021/ja403583s
21. L. Huang, Y. Pan, L. Pan, M. Gao, W. Xu, Y. Que, H. Zhou, Y. Wang, S. Du, and H.-J. Gao, Appl. Phys. Lett. 99, 163107 (2011). 10.1063/1.3653241