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Physical Review Letters

Volumn 112, Issue 16, 2014, Pages

Co tip functionalization inverts atomic force microscopy contrast via short-range electrostatic forces

(4) Schneiderbauer, Maximilian a Emmrich, Matthias a Weymouth, Alfred J a Giessibl, Franz J a

a UNIVERSITY OF REGENSBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; SCANNING TUNNELING MICROSCOPY;

ATOMIC FORCE; ATOMIC POSITIONS; BARE METALS; CU(1 0 0); ELECTROSTATIC MODELING; FUNCTIONALIZATIONS; NONCONTACT ATOMIC FORCE MICROSCOPY; POLAR SURFACES;

ATOMIC FORCE MICROSCOPY;

EID: 84899534533 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.112.166102 Document Type: Article

Times cited : (65)

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