Performance of high-resolution SEM/EDX systems equipped with transmission mode (TSEM) for imaging and measurement of size and size distribution of spherical nanoparticles

Microscopy and Microanalysis

Volumn 20, Issue 2, 2014, Pages 602-612

  Hodoroaba, Vasile Dan ^a   Motzkus, Charles ^b   Macé, Tatiana ^b   Vaslin Reimann, Sophie ^b  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

EDX; high resolution scanning electron microscope (SEM); large area SDD; nanoparticles; size; size distribution; transmission; transmission scanning electron microscopy microscope (TSEM, T SEM, STEM)

Indexed keywords

NANOPARTICLE;

EVALUATION STUDY; PARTICLE SIZE; PROCEDURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTROMETRY; ULTRASTRUCTURE;

MICROSCOPY, ELECTRON, SCANNING TRANSMISSION; NANOPARTICLES; PARTICLE SIZE; SPECTROMETRY, X-RAY EMISSION;

EID: 84899476303     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614000014     Document Type: Article

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