Inter-laboratory comparison: Quantitative surface analysis of thin Fe-Ni alloy films

Surface and Interface Analysis

Volumn 44, Issue 2, 2012, Pages 192-199

  Kim, K J ^a   Unger, W E S ^b   Kim, J W ^a   Moon, D W ^a   Gross, T ^b   Hodoroaba, V D ^b   Schmidt, D ^b   Wirth, T ^b   Jordaan, W ^c   Van Staden, M ^c   Prins, S ^c   Zhang, L ^d   Fujimoto, T ^d   Song, X P ^e   Wang, H ^e  

^a Korea Research Institute of Standards and Science   (South Korea)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c NATIONAL METROLOGY INSTITUTE OF SOUTH AFRICA   (South Africa)

^d NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^e NATIONAL INSTITUTE OF METROLOGY   (China)

Author keywords

Fe Ni alloy; key comparison; quantification; traceability; uncertainty

Indexed keywords

FENI ALLOYS; KEY COMPARISON; QUANTIFICATION; TRACEABILITY; UNCERTAINTY;

ALLOYS; CERIUM ALLOYS; CHEMICAL ANALYSIS; INDUCTIVELY COUPLED PLASMA; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ISOTOPES; METALLIC FILMS; SURFACE ANALYSIS;

IRON ALLOYS;

EID: 84856112677     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3795     Document Type: Article

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