Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurement techniques: An interlaboratory comparison study

Journal of Nanoparticle Research

Volumn 15, Issue 10, 2013, Pages

  Motzkus, C ^a   Mace T ^a   Gaie Levrel, F ^a   Ducourtieux, S ^a   Delvallee, A ^a   Dirscherl, K ^b   Hodoroaba, V D ^c   Popov, I ^d   Popov, O ^e   Kuselman, I ^e   Takahata, K ^f   Ehara, K ^f   Ausset, P ^g   Maille M ^g   Michielsen, N ^h   Bondiguel, S ^h   Gensdarmes, F ^h   Morawska, L ⁱ   Johnson, G R ⁱ   Faghihi, E M ⁱ   Kim, C S ^j   Kim, Y H ^j   Chu, M C ^j   Guardado, J A ^k   Salas, A ^k   Capannelli, G ^l   Costa, C ^l   Bostrom, T ⁱ   Jamting A K ^m   Lawn, M A ^m   Adlem, L ⁿ   Vaslin Reimann, S ^a   more..

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

^b DANISH FUNDAMENTAL METROLOGY   (Denmark)

^c BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^d HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^e National Physical Laboratory of Israel   (Israel)

^f NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^g LABORATOIRE INTERUNIVERSITAIRE DES SYSTÈMES ATMOSPHÉRIQUES   (France)

^h INSTITUT DE RADIOPROTECTION ET DE SÛRETÉ NUCLÉAIRE IRSN   (France)

ⁱ QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

^j Korea Research Institute of Standards and Science   (South Korea)

^k CENTRO NACIONAL DE METROLOGÍA   (Mexico)

^l UNIVERSITY OF GENOA   (Italy)

^m NATIONAL MEASUREMENT INSTITUTE   (Australia)

ⁿ NATIONAL METROLOGY INSTITUTE OF SOUTH AFRICA   (South Africa)

more..

Author keywords

Atomic force microscopy; Interlaboratory comparison; Metrological traceability; Scanning and transmission electron microscopies; Scanning mobility particle size spectrometers

Indexed keywords

AEROSOLS; ATOMIC FORCE MICROSCOPY; ELECTROSTATIC SEPARATORS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICA; NANOPARTICLES; PARTICLE SIZE; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; SILICA; SILICA NANOPARTICLES; SILICON; SIZE DISTRIBUTION; SPECTROMETERS; TRANSMISSIONS; UNCERTAINTY ANALYSIS;

CHARACTERIZATION MEASUREMENT; ELECTROSTATIC PRECIPITATION; INTERLABORATORY COMPARISON; INTERLABORATORY COMPARISON STUDIES; METROLOGICAL TRACEABILITYS; NANOPARTICLES CHARACTERIZATIONS; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SCANNING MOBILITY;

SIO2 NANOPARTICLES;

NANOPARTICLE; SILICON DIOXIDE; SILICON DIOXIDE NANOPARTICLE; UNCLASSIFIED DRUG;

AEROSOL; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; CONTROLLED STUDY; ELECTROSTATIC PRECIPITATION; EVALUATION; MEASUREMENT; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SCANNING MOBILITY PARTICLE SIZE SPECTROMETER; SPECTROMETER; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84883730015     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-013-1919-4     Document Type: Article

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