Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM

Microscopy and Microanalysis

Volumn 18, Issue S2, 2012, Pages 1750-1751

  Hodoroaba, V D ^a   Benemann, S ^a   Motzkus, C ^b   Mace T ^b   Palmas, P ^b   Vaslin Reimann, S ^b  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85009561944     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612010604     Document Type: Article

References (2)

1. C. Motzkus, T. Mace and S. Vaslin-Reimann, (2010) Metrology of Airborne Nanoparticles, Standardization and Applications (MANSA), 8-9 June 2010, Teddington, UK
2. E. Buhr, N. Senftleben, T. Klein, D. Bergmann, D. Gnieser, C.G. Frase and H. Bosse, Meas. Sci. Technol. 20 (2009) 413.