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Volumn 126, Issue 3, 2002, Pages 255-265
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Measurement of 100-nm polystyrene sphere by transmission electron microscope
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Author keywords
Acceleration voltage; Intensity; Internal calibrator; Polystyrene sphere; Shrinkage; Standard particle; TEM
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Indexed keywords
ELECTRON BEAMS;
SHRINKAGE;
TRANSMISSION ELECTRON MICROSCOPY;
BEAM INTENSITY;
POLYSTYRENES;
POLYSTYRENE;
ELECTRON MICROSCOPY;
MEASUREMENT METHOD;
POLYSTYRENE;
SPHERE;
ACCURACY;
ARTICLE;
CALIBRATOR;
ELECTRIC POTENTIAL;
ELECTRON BEAM;
PARTICLE SIZE;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 0037067904
PISSN: 00325910
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-5910(02)00062-1 Document Type: Article |
Times cited : (17)
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References (13)
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