Energy dispersive electron probe microanalysis (ED-EPMA) of elemental composition and thickness of Fe-Ni alloy films

Surface and Interface Analysis

Volumn 44, Issue 11-12, 2012, Pages 1459-1461

  Hodoroaba, Vasile Dan ^a   Kim, Kyung Joong ^b   Unger, Wolfgang E S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

CCQM; Elemental composition; Energy dispersive electron probe microanalysis (ED EPMA); Fe Ni; K values; Mass coverage; STRATAGem; Thickness; Thin films

Indexed keywords

BINARY ALLOYS; IRON ALLOYS; IRON METALLOGRAPHY; METALLIC FILMS; NICKEL ALLOYS; NICKEL METALLOGRAPHY; PROBES; SPECTROMETERS; THIN FILMS; UNCERTAINTY ANALYSIS;

CCQM; ELEMENTAL COMPOSITIONS; ENERGY DISPERSIVE; K-VALUES; MASS COVERAGE; STRATAGEM; THICKNESS;

ELECTRON PROBE MICROANALYSIS;

EID: 84882385834     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.4975     Document Type: Conference Paper

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