Understanding the electrical impact of edge contacts in few-layer graphene

ACS Nano

Volumn 8, Issue 4, 2014, Pages 3584-3589

  Chu, Tao ^a   Chen, Zhihong ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

2D layered materials; contact resistance; edge contact; few layer graphene

Indexed keywords

CONTACT RESISTANCE; MATERIALS SCIENCE;

CURRENT TRANSPORT; EDGE CONTACTS; FEW-LAYER GRAPHENE; LAYERED MATERIAL; OPTOELECTRONIC APPLICATIONS; RESISTOR NETWORK; TRANSITION METAL DICHALCOGENIDES; TUNNELING RESISTANCE;

GRAPHENE;

EID: 84899431697     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn500043y     Document Type: Article

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