메뉴 건너뛰기




Volumn 29, Issue 7, 2014, Pages 3625-3636

Design and implementation of integrated common mode capacitors for SiC-JFET inverters

Author keywords

Electromagnetic compatibility; inverters; multichip modules

Indexed keywords

AIRCRAFT APPLICATIONS; CONDUCTED EMI EMISSION; CONDUCTED EMISSIONS; DESIGN AND IMPLEMENTATIONS; HIGH FREQUENCY HF; HIGH-FREQUENCY NOISE; INTEGRATED CAPACITORS; SWITCHING WAVEFORMS;

EID: 84897712831     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2013.2279772     Document Type: Article
Times cited : (51)

References (26)
  • 1
    • 0024749835 scopus 로고
    • Power semiconductor device figure ofmerit for high-frequency applications
    • Oct.
    • B.Baliga, "Power semiconductor device figure ofmerit for high-frequency applications," IEEE Electron Device Lett., vol. 10, no. 10, pp. 455-457, Oct. 1989.
    • (1989) IEEE Electron Device Lett. , vol.10 , Issue.10 , pp. 455-457
    • Baliga, B.1
  • 4
    • 49249128415 scopus 로고    scopus 로고
    • Acompact, high voltage 25 kW, 50 kHz DC-DC converter based on SiC JFETs
    • Jun.
    • D.Aggeler, J. Biela, and J.Kolar, "Acompact, high voltage 25 kW, 50 kHz DC-DC converter based on SiC JFETs," in Proc. 39th Power Electron. Spec. Conf., Jun. 2008, pp. 801-807.
    • (2008) Proc. 39th Power Electron. Spec. Conf. , pp. 801-807
    • Aggeler, D.1    Biela, J.2    Kolar, J.3
  • 6
    • 80053180055 scopus 로고    scopus 로고
    • Evaluation of a 1200 V, 800 A all SiC dual module
    • Sep.
    • R. Wood and T. Salem, "Evaluation of a 1200 V, 800 A all SiC dual module," IEEE Trans. Power Electron., vol. 26, no. 9, pp. 2504-2511, Sep. 2011.
    • (2011) IEEE Trans. Power Electron. , vol.26 , Issue.9 , pp. 2504-2511
    • Wood, R.1    Salem, T.2
  • 8
    • 72949104362 scopus 로고    scopus 로고
    • Common-mode emissions measurements and simulation in variable-speed drive systems
    • Nov.
    • C. Jettanasen, F. Costa, and C. Vollaire, "Common-mode emissions measurements and simulation in variable-speed drive systems," IEEE Trans. Power Electron., vol. 24, no. 11, pp. 2456-2464, Nov. 2009.
    • (2009) IEEE Trans. Power Electron. , vol.24 , Issue.11 , pp. 2456-2464
    • Jettanasen, C.1    Costa, F.2    Vollaire, C.3
  • 9
    • 72449202598 scopus 로고    scopus 로고
    • Design considerations of a fast 0-Ohm gate-drive circuit for 1.2 kV SiC JFET devices in phaseleg configuration
    • Sep.
    • R. Burgos, Z. Chen, D. Boroyevich, and F.Wang, "Design considerations of a fast 0-Ohm gate-drive circuit for 1.2 kV SiC JFET devices in phaseleg configuration," in Proc. 1st Energy Convers. Congr. Expo., Sep. 2009, pp. 2293-2300.
    • (2009) Proc. 1st Energy Convers. Congr. Expo. , pp. 2293-2300
    • Burgos, R.1    Chen, Z.2    Boroyevich, D.3    Wang, F.4
  • 10
    • 85008054196 scopus 로고    scopus 로고
    • Impact of EMC filters on the power density of modern three-phase PWM converters
    • Jun.
    • M. Heldwein and J. Kolar, "Impact of EMC filters on the power density of modern three-phase PWM converters," IEEE Trans. Power Electron., vol. 24, no. 6, pp. 1577-1588, Jun. 2009.
    • (2009) IEEE Trans. Power Electron. , vol.24 , Issue.6 , pp. 1577-1588
    • Heldwein, M.1    Kolar, J.2
  • 12
    • 38349027303 scopus 로고    scopus 로고
    • Attenuation of conducted EMI emissions from an inverter-driven motor
    • Jan.
    • H. Akagi and T. Shimizu, "Attenuation of conducted EMI emissions from an inverter-driven motor," IEEE Trans. Power Electron., vol. 23, no. 1, pp. 282-290, Jan. 2008.
    • (2008) IEEE Trans. Power Electron. , vol.23 , Issue.1 , pp. 282-290
    • Akagi, H.1    Shimizu, T.2
  • 13
    • 46449131384 scopus 로고    scopus 로고
    • Impedance interaction and EMI attenuation in converters with an integrated transmission-line filter
    • A. Baisden, D. Boroyevich, and J. van Wyk, "Impedance interaction and EMI attenuation in converters with an integrated transmission-line filter," in Proc. 22th Appl. Power Electron. Conf., 2007, pp. 1203-1208.
    • (2007) Proc. 22th Appl. Power Electron. Conf. , pp. 1203-1208
    • Baisden, A.1    Boroyevich, D.2    Van Wyk, J.3
  • 14
    • 19144371232 scopus 로고    scopus 로고
    • Improving the characteristics of integrated EMI filters by embedded conductive layers
    • DOI 10.1109/TPEL.2005.846526
    • R. Chen, J. van Wyk, S. Wang, and W. Odendaal, "Improving the characteristics of integrated EMI filters by embedded conductive layers," IEEE Trans. Power Electron., vol. 20, no. 3, pp. 611-619, May 2005. (Pubitemid 40715009)
    • (2005) IEEE Transactions on Power Electronics , vol.20 , Issue.3 , pp. 611-619
    • Chen, R.1    Van Wyk, J.D.2    Wang, S.3    Odendaal, W.G.4
  • 17
    • 76649133450 scopus 로고    scopus 로고
    • SiC wirebond multichip phase-leg module packaging design and testing for harsh environment
    • Jan.
    • P. Ning, R. Lai, D. Huff, F. Wang, K. Ngo, V. Immanuel, and K. Karimi, "SiC wirebond multichip phase-leg module packaging design and testing for harsh environment," IEEE Trans. Power Electron., vol. 25, no. 1, pp. 16-23, Jan. 2010.
    • (2010) IEEE Trans. Power Electron. , vol.25 , Issue.1 , pp. 16-23
    • Ning, P.1    Lai, R.2    Huff, D.3    Wang, F.4    Ngo, K.5    Immanuel, V.6    Karimi, K.7
  • 18
    • 79551657496 scopus 로고    scopus 로고
    • Modelling, analysis, and experimental study of SiC JFET body diode
    • T. Ben Salah, Y. Lahbib, and H. Morel, "Modelling, analysis, and experimental study of SiC JFET body diode," Eur. Phys. J. Appl. Phys., vol. 53, no. 1, pp. 30305-1-30305-8, 2011.
    • (2011) Eur. Phys. J. Appl. Phys. , vol.53 , Issue.1 , pp. 303051-303058
    • Ben Salah, T.1    Lahbib, Y.2    Morel, H.3
  • 20
    • 84862920940 scopus 로고    scopus 로고
    • Temperature dependent characteristics of SiC devices: Performance evaluation and loss calculation
    • Feb.
    • D. Jiang, R. Burgos, F.Wang, andD. Boroyevich, "Temperature dependent characteristics of SiC devices: Performance evaluation and loss calculation," IEEE Trans. Power Electron., vol. 27, no. 1, pp. 1013-1024, Feb. 2012.
    • (2012) IEEE Trans. Power Electron. , vol.27 , Issue.1 , pp. 1013-1024
    • Jiang, D.1    Burgos, R.2    Boroyevich, D.3
  • 22
    • 77955452100 scopus 로고    scopus 로고
    • Minimization of drain-to-gate interaction in a SiC JFET inverter using an external gate-source capacitor
    • O.Berry,Y.Hamieh, S. Räel, F. Meibody-Tabar, S.Vieillard, D. Bergogne, and H. Morel, "Minimization of drain-to-gate interaction in a SiC JFET inverter using an external gate-source capacitor," Mater. Sci. Forum, vol. 645, pp. 957-960, 2010.
    • (2010) Mater. Sci. Forum , vol.645 , pp. 957-960
    • Berryy.O1    Rael, S.2    Meibody-Tabar, F.3    Vieillard, S.4    Bergogne, D.5    Morel, H.6
  • 23
    • 34547899192 scopus 로고    scopus 로고
    • Analysis of electromagnetic coupling and current distribution inside a power module
    • DOI 10.1109/TIA.2007.900453
    • C. Martin, J.-L. Schanen, J.-M. Guichon, and R. Pasterczyk, "Analysis of electromagnetic coupling and current distribution inside a power module," IEEE Trans. Ind. Appl., vol. 43, no. 4, pp. 893-901, Jul. 2007. (Pubitemid 47249962)
    • (2007) IEEE Transactions on Industry Applications , vol.43 , Issue.4 , pp. 893-901
    • Martin, C.1    Schanen, J.-L.2    Guichon, J.-M.3    Pasterczyk, R.4
  • 25
    • 84897717961 scopus 로고    scopus 로고
    • Environmental conditions and test procedures for airborne equipment
    • Mar.
    • Environmental Conditions and Test Procedures for Airborne Equipment, RTCA Standard DO-160F/EUROCAE 14F, Mar. 2008.
    • (2008) RTCA Standard DO-160F/EUROCAE 14F


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.