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Physical Review B - Condensed Matter and Materials Physics

Volumn 89, Issue 5, 2014, Pages

Structural and electronic properties of β - 2 nanoparticles: The role of stacking fault domains

(12) Imlau, Robert a Kovács, András a Mehmedovic, Ervin b Xu, Pengxiang a Stewart, Andrew A c,d Leidinger, Christine a Dunin Borkowski, Rafal E a Bihlmayer, Gustav a Wiggers, Hartmut b Carius, Reinhard a Kolb, Ute c,e Luysberg, Martina a

a FORSCHUNGSZENTRUM JÜLICH (Germany)

b UNIVERSITY OF DUISBURG ESSEN (Germany)

c JOHANNES GUTENBERG UNIVERSITY (Germany)

d UNIVERSITY OF LIMERICK (Ireland)

e DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84897679833 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.89.054104 Document Type: Article

Times cited : (6)

References (26)

1
- 0030616229
- A silicon/iron-disllicide light-emitting diode operating at a wavelength of 1.5 μm
- DOI 10.1038/42667
- D. Leong, M. Harry, K. J. Reeson, and K. P. Homewood, Nature 387, 686 (1997). 10.1038/42667 (Pubitemid 27270603)
- (1997) Nature , vol.387 , Issue.6634 , pp. 686-688
- Leong, D.¹ Harry, M.² Reeson, K.J.³ Homewood, K.P.⁴

2
- 0028055481
- 10.1557/PROC-320-115
- K. Radermacher, O. Skeide, R. Carius, J. Klomfaß, and S. Manti, MRS Proceedings 320, 115 (1993). 10.1557/PROC-320-115
- (1993) MRS Proceedings , vol.320 , pp. 115
- Radermacher, K.¹ Skeide, O.² Carius, R.³ Klomfaß, J.⁴ Manti, S.⁵

3
- 33646665371
- ., 2696. 10.1063/1.335906
- M. C. Bost and J. E. Mahan, J. Appl. Phys. 58, 2696 (1985). 10.1063/1.335906
- (1985) J. Appl. Phys , vol.58
- Bost, M.C.¹ Mahan, J.E.²

4
- 0000651364
- 10.1107/S0567740871003765
- P. Y. Dusausoy, J. Protas, R. Wandji, and B. Roques, Acta Crystallogr. B 27, 1209 (1971). 10.1107/S0567740871003765
- (1971) Acta Crystallogr. B , vol.27 , pp. 1209
- Dusausoy, P.Y.¹ Protas, J.² Wandji, R.³ Roques, B.⁴

5
- 0003689862
- ed., ASM international 1108
- Binary alloy phase diagram, ed. T. B. Massalski, ASM international 1108, (1987).
- (1987) Binary Alloy Phase Diagram
- Massalski, T.B.¹

6
- 64549155335
- 10.1016/j.jallcom.2008.08.078
- H. Yamane and T. Yamada, J. Alloy Comp. 476, 282 (2009). 10.1016/j.jallcom.2008.08.078
- (2009) J. Alloy Comp. , vol.476 , pp. 282
- Yamane, H.¹ Yamada, T.²

7
- 79955726215
- JAPIAU 0021-8979 10.1063/1.3573671
- H. F. Liu, A. Huang, and D. Z. Chi, J. Appl. Phys. 109, 083538 (2011). JAPIAU 0021-8979 10.1063/1.3573671
- (2011) J. Appl. Phys. , vol.109 , pp. 083538
- Liu, H.F.¹ Huang, A.² Chi, D.Z.³

8
- 36749020630
- Formation processes of iron silicide nanoparticles studied by ex situ and in situ transmission electron microscopy
- DOI 10.1063/1.2815649
- J. H. Won, A. Kovacs, M. Naito, M. Ishimaru, and Y. Hirotsu, J. Appl. Phys. 102, 103512 (2007). JAPIAU 0021-8979 10.1063/1.2815649 (Pubitemid 350199457)
- (2007) Journal of Applied Physics , vol.102 , Issue.10 , pp. 103512
- Won, J.¹ Kovacs, A.² Naito, M.³ Ishimaru, M.⁴ Hirotsu, Y.⁵

9
- 80053576804
- THSFAP 0040-6090 10.1016/j.tsf.2011.05.021
- Y. Terai, K. Noda, K. Yoneda, H. Udono, Y. Maeda, and Y. Fujiwara, Thin Solid Films 519, 8468 (2011). THSFAP 0040-6090 10.1016/j.tsf.2011.05.021
- (2011) Thin Solid Films , vol.519 , pp. 8468
- Terai, Y.¹ Noda, K.² Yoneda, K.³ Udono, H.⁴ Maeda, Y.⁵ Fujiwara, Y.⁶

10
- 0034666979
- 2 with lattice distortions corresponding to the epitaxial relationships on Si(111)
- DOI 10.1103/PhysRevB.62.11063
- D. B. Migas and L. Miglio, Phys. Rev. B 62, 11063 (2000). PRBMDO 1098-0121 10.1103/PhysRevB.62.11063 (Pubitemid 32367278)
- (2000) Physical Review B - Condensed Matter and Materials Physics , vol.62 , Issue.16 , pp. 11063-11070
- Migas, D.B.¹ Miglio, L.²

11
- 0035155627
- 2
- DOI 10.1016/S0040-6090(00)01739-9
- H. Lange, Thin Solid Films 381, 171 (2001). THSFAP 0040-6090 10.1016/S0040-6090(00)01739-9 (Pubitemid 32093291)
- (2001) Thin Solid Films , vol.381 , Issue.2 , pp. 171-175
- Lange, H.¹

12
- 0000609776
- 10.1103/PhysRevB.50.18330
- S. Eisebitt, J. E. Rubensson, M. Nicodemus, T. Böske, S. Blügel, W. Eberhardt, K. Radermacher, S. Mantl, and G. Bihlmayer, Phys Rev. B 50, 18330 (1994). 10.1103/PhysRevB.50.18330
- (1994) Phys Rev. B , vol.50 , pp. 18330
- Eisebitt, S.¹ Rubensson, J.E.² Nicodemus, M.³ Böske, T.⁴ Blügel, S.⁵ Eberhardt, W.⁶ Radermacher, K.⁷ Mantl, S.⁸ Bihlmayer, G.⁹

13
- 0347211605
- NMAEE7 0965-9773 10.1016/S0965-9773(97)00013-5
- H. Hahn, Nanostruct. Mater. 9, 3 (1997). NMAEE7 0965-9773 10.1016/S0965-9773(97)00013-5
- (1997) Nanostruct. Mater. , vol.9 , pp. 3
- Hahn, H.¹

14
- 84881116131
- JNARFA 1388-0764 10.1007/s11051-013-1878-9
- R. Bywalez, H. Orthner, E. Mehmedovic, R. Imlau, A. Kovacs, M. Luysberg, and H. Wiggers, J. Nanopart. Res. 15, 1878 (2013). JNARFA 1388-0764 10.1007/s11051-013-1878-9
- (2013) J. Nanopart. Res. , vol.15 , pp. 1878
- Bywalez, R.¹ Orthner, H.² Mehmedovic, E.³ Imlau, R.⁴ Kovacs, A.⁵ Luysberg, M.⁶ Wiggers, H.⁷

15
- 79957984260
- CRTEDF 0232-1300 10.1002/crat.201100036
- U. Kolb, E. Mugnaioli, and T. E. Gorelik, Cryst. Res. Technol. 46, 542 (2011). CRTEDF 0232-1300 10.1002/crat.201100036
- (2011) Cryst. Res. Technol. , vol.46 , pp. 542
- Kolb, U.¹ Mugnaioli, E.² Gorelik, T.E.³

16
- 33847173656
- Towards automated diffraction tomography: Part I-Data acquisition
- DOI 10.1016/j.ultramic.2006.10.007, PII S0304399106002166, ELCRYST 2005
- U. Kolb, T. Gorelik, C. Kübel, M. T. Otten, and D. Hubert, Ultramicroscopy 107, 507 (2007); ULTRD6 0304-3991 10.1016/j.ultramic.2006.10.007 16b U. Kolb, T. Gorelik, and M. T. Otten, Ultramicroscopy 108, 763 (2008). ULTRD6 0304-3991 10.1016/j.ultramic.2007.12.002 (Pubitemid 46283611)
- (2007) Ultramicroscopy , vol.107 , Issue.6-7 , pp. 507-513
- Kolb, U.¹ Gorelik, T.² Kubel, C.³ Otten, M.T.⁴ Hubert, D.⁵

17
- 4444221565
- 10.1002/jcc.20084
- E. F. Pettersen, T. D. Goddard, C. C. Huang, G. S. Couch, D. M. Greenblatt, E. C. Meng, and T. E. Ferrin, J. Comput. Chem. 13, 1605 (2004). 10.1002/jcc.20084
- (2004) J. Comput. Chem. , vol.13 , pp. 1605
- Pettersen, E.F.¹ Goddard, T.D.² Huang, C.C.³ Couch, G.S.⁴ Greenblatt, D.M.⁵ Meng, E.C.⁶ Ferrin, T.E.⁷

18
- 77952319838
- ULTRD6 0304-3991 10.1016/j.ultramic.2009.10.006
- C. L. Jia, L. Houben, A. Thust, and J. Barthel, Ultramicroscopy 110, 500 (2010). ULTRD6 0304-3991 10.1016/j.ultramic.2009.10.006
- (2010) Ultramicroscopy , vol.110 , pp. 500
- Jia, C.L.¹ Houben, L.² Thust, A.³ Barthel, J.⁴

19
- 0023162961
- EMS - A software package for electron diffraction analysis and hrem image simulation in materials science
- DOI 10.1016/0304-3991(87)90080-5
- P. Stadelmann, Ultramicroscopy 21, 131 (1987). ULTRD6 0304-3991 10.1016/0304-3991(87)90080-5 (Pubitemid 17558009)
- (1987) Ultramicroscopy , vol.21 , Issue.2 , pp. 131-145
- Stadelmann, P.A.¹

20
- 70349977075
- ULTRD6 0304-3991 10.1016/j.ultramic.2009.07.007
- M. Heidelmann, J. Barthel, and L. Houben, Ultramicroscopy 109, 1447 (2009). ULTRD6 0304-3991 10.1016/j.ultramic.2009.07.007
- (2009) Ultramicroscopy , vol.109 , pp. 1447
- Heidelmann, M.¹ Barthel, J.² Houben, L.³

21
- 8844219664
- Automated spatial drift correction for EFTEM image series
- DOI 10.1016/j.ultramic.2004.08.003, PII S0304399104001652
- B. Schaffer, W. Grogger, and G. Kothleitner, Ultramicroscopy 102, 27 (2004). ULTRD6 0304-3991 10.1016/j.ultramic.2004.08.003 (Pubitemid 39531893)
- (2004) Ultramicroscopy , vol.102 , Issue.1 , pp. 27-36
- Schaffer, B.¹ Grogger, W.² Kothleitner, G.³

22
- 4243943295
- PRLTAO 0031-9007 10.1103/PhysRevLett.77.3865
- J. P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. 77, 3865 (1996). PRLTAO 0031-9007 10.1103/PhysRevLett.77.3865
- (1996) Phys. Rev. Lett. , vol.77 , pp. 3865
- Perdew, J.P.¹ Burke, K.² Ernzerhof, M.³

23
- 0032723949
- ., 946
- L. A. J. Garvie and P. R. Buseck, Amer. Mineral. 84, 946 (1999).
- (1999) Amer. Mineral , vol.84
- Garvie, L.A.J.¹ Buseck, P.R.²

24
- 42149145441
- ELNES analysis for silicon, silicon oxide and their interface
- DOI 10.1238/Physica.Topical.115a01099, Proceedings of the 12th X-ray Absorption Fine Structure International Conference, XAFS12
- H. Matsumoto, S. Nagamatsu, M. Nakazawa, and T. Fujikawa, Physica Scripta 115, 1099 (2005). 10.1238/Physica.Topical.115a01099 (Pubitemid 351525087)
- (2005) Physica Scripta T , vol.T115 , pp. 1099-1101
- Matsumoto, H.¹ Nagamatsu, S.-I.² Nakazawa, M.³ Fujikawa, T.⁴

25
- 36448998849
- Electrical characterization of the β-FeSi2/Si heterojunction after thermal oxidation
- DOI 10.1063/1.116770, PII S0003695196045019
- U. Erlesand and M. Östling, Appl. Phys. Lett. 68, 105 (1996). APPLAB 0003-6951 10.1063/1.116770 (Pubitemid 126688222)
- (1996) Applied Physics Letters , vol.68 , Issue.1 , pp. 105-107
- Erlesand, U.¹ Ostling, M.²

26
- 0026851172
- ., 122. 10.1107/S0021889891010890
- Y. Zheng, A. Taccoen, and J. F. Petroff, J. Appl. Crystall. 25, 122 (1992). 10.1107/S0021889891010890
- (1992) J. Appl. Crystall , vol.25
- Zheng, Y.¹ Taccoen, A.² Petroff, J.F.³

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