Automated electron diffraction tomography - A new tool for nano crystal structure analysis

Crystal Research and Technology

Volumn 46, Issue 6, 2011, Pages 542-554

  Kolb, U ^a   Mugnaioli, E ^a   Gorelik, T E ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

electron diffraction; reciprocal space tomography; structure determination

Indexed keywords

3D DIFFRACTION; AB INITIO; AB INTIO; CELL PARAMETER; CRYSTAL STRUCTURE ANALYSIS; DIFFRACTION MODES; DIFFRACTION TOMOGRAPHY; DIRECT METHOD; DYNAMICAL EFFECTS; ELECTRON DOSE; INTENSITY DATA; MICRO-PROBES; OPTIMISATIONS; RECIPROCAL SPACE; REFLECTION INTENSITY; SPACE GROUPS; STRUCTURE ANALYSIS; STRUCTURE DETERMINATION; STRUCTURE SOLUTIONS;

AUTOMATION; ELECTRON DIFFRACTION; ELECTRONS; TOMOGRAPHY; X RAY CRYSTALLOGRAPHY;

CRYSTAL STRUCTURE;

EID: 79957984260     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201100036     Document Type: Conference Paper

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