Effects of stacking fault on the diffraction intensities of β-FeSi2

Journal of Alloys and Compounds

Volumn 476, Issue 1-2, 2009, Pages 282-287

  Yamane, Hisanori ^a   Yamada, Takahiro ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Electron diffraction; Na flux; Rietveld analysis; Stacking fault; X ray powder diffraction

Indexed keywords

DIFFRACTION INTENSITIES; FAULT STRUCTURES; FE POWDERS; HEATING MIXTURES; MODEL-BASED; NA FLUX; POWDER X-RAY DIFFRACTIONS; RECURSION METHODS; SLIP SYSTEMS; STACKING LAYERS; STAINLESS TUBES; X-RAY POWDER DIFFRACTION;

DIFFRACTION GRATINGS; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; ELECTRON TUBES; HOLOGRAPHIC INTERFEROMETRY; MOSFET DEVICES; POWDER METALS; RIETVELD ANALYSIS; RIETVELD METHOD; SMELTING; SODIUM; VAPOR PRESSURE; VAPORS; X RAY DIFFRACTION; X RAYS;

STACKING FAULTS;

EID: 64549155335     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.08.078     Document Type: Article

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