Elemental analysis down to the single atom with electron beams

Comptes Rendus Physique

Volumn 15, Issue 2-3, 2014, Pages 151-157

  Suenaga, Kazu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

EDX; EELS; Low dimension materials; Single atom spectroscopy; STEM

Indexed keywords

EID: 84897590492     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crhy.2013.12.003     Document Type: Short Survey

References (22)

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