Fault detection of non-Gaussian processes based on model migration

IEEE Transactions on Control Systems Technology

Volumn 21, Issue 5, 2013, Pages 1517-1526

  Zhang, Yingwei ^a   An, Jiayu ^a   Ma, Chi ^a  

^a KEY LABORATORY OF INTEGRATED AUTOMATION OF PROCESS INDUSTRY   (China)

Author keywords

Common and specific correlations; Fault detection; Independent component analysis; Model migration; Similarity

Indexed keywords

COMMON AND SPECIFIC CORRELATIONS; CONTINUOUS ANNEALING PROCESS; DETECTION ABILITY; MODEL MIGRATIONS; MONITORING METHODS; MONITORING PROCESS; NON-GAUSSIAN PROCESS; SIMILARITY;

BATCH DATA PROCESSING; FAULT DETECTION; FEATURE EXTRACTION; INDEPENDENT COMPONENT ANALYSIS; PROCESS MONITORING;

GAUSSIAN NOISE (ELECTRONIC);

EID: 84897584022     PISSN: 10636536     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCST.2012.2217966     Document Type: Article

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