Tuning the dead-layer behavior of La0.67Sr 0.33MnO3/SrTiO3 via interfacial engineering

Applied Physics Letters

Volumn 104, Issue 8, 2014, Pages

  Peng, R ^a   Xu, H C ^a   Xia, M ^a   Zhao, J F ^a   Xie, X ^a   Xu, D F ^a   Xie, B P ^a   Feng, D L ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DETERIORATION; ELECTRONS; MOLECULAR BEAM EPITAXY; OXYGEN VACANCIES;

ATOMIC LAYER; BULK PROPERTIES; DEAD LAYERS; ELECTROSTATIC MODELING; INTERFACE LAYER; OXIDE HETEROSTRUCTURES; SYSTEMATIC STUDY; ULTRA-THIN;

SEMICONDUCTOR DOPING;

EID: 84896751022     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4866461     Document Type: Article

References (41)

1. M. Bowen, M. Bibes, A. Barthelemy, J. P. Contour, A. Anane, Y. Lemaitre, and A. Fert, Appl. Phys. Lett. 82, 233 (2003). 10.1063/1.1534619
2. J. H. Park, E. Vescovo, H. J. Kim, C. Kwon, R. Ramesh, and T. Venkatesan, Nature 392, 794 (1998). 10.1038/33883
3. A. Moreo, S. Yunoki, and E. Dagotto, Science 283, 2034 (1999). 10.1126/science.283.5410.2034
4. S. Brivio, M. Cantoni, D. Petti, and R. Bertacco, J. Appl. Phys. 108, 113906 (2010). 10.1063/1.3516283
5. T. Yajima, Y. Hikita, and H. Y. Hwang, Nature Mater. 10, 198 (2011). 10.1038/nmat2946
6. B. Kim, D. Kwon, J. H. Song, Y. Hikita, B. G. Kim, and H. Y. Hwang, Solid State Commun. 150, 598 (2010). 10.1016/j.ssc.2009.12.041
7. M. C. Dekker, A. Herklotz, L. Schultz, M. Reibold, K. Vogel, M. D. Biegalski, H. M. Christen, and K. Dörr, Phys. Rev. B 84, 054463 (2011). 10.1103/PhysRevB.84.054463
8. J. Z. Suna, D. W. Abraham, R. A. Rao, and C. B. Eom, Appl. Phys. Lett. 74, 3017 (1999). 10.1063/1.124050
9. L. M. Wang and C.-C. Guo, Appl. Phys. Lett. 87, 172503 (2005). 10.1063/1.2112167
10. S. R. Bakaul, W. Lin, and T. Wu, Appl. Phys. Lett. 99, 042503 (2011). 10.1063/1.3615708
11. F. Y. Bruno, J. Garcia-Barriocanal, M. Varela, N. M. Nemes, P. Thakur, J. C. Cezar, N. B. Brookes, A. Rivera-Calzada, M. Garcia-Hernandez, C. Leon, S. Okamoto, S. J. Pennycook, and J. Santamaria, Phys. Rev. Lett. 106, 147205 (2011). 10.1103/PhysRevLett.106.147205
12. J. S. Lee, D. A. Arena, P. Yu, C. S. Nelson, R. Fan, C. J. Kinane, S. Langridge, M. D. Rossell, R. Ramesh, and C. C. Kao, Phys. Rev. Lett. 105, 257204 (2010). 10.1103/PhysRevLett.105.257204
13. A. Tebano, A. Orsini, P. G. Medaglia, D. DiCastro, G. Balestrino, B. Freelon, A. Bostwick, Y. J. Chang, G. Gaines, E. Rotenberg, and N. L. Saini, Phys. Rev. B 82, 214407 (2010). 10.1103/PhysRevB.82.214407
14. A. Tebano, C. Aruta, S. Sanna, P. G. Medaglia, G. Balestrino, A. A. Sidorenko, R. DeRenzi, G. Ghiringhelli, L. Braicovich, V. Bisogni, and N. B. Brookes, Phys. Rev. Lett. 100, 137401 (2008). 10.1103/PhysRevLett.100.137401
15. H. Boschker, J. Kautz, E. P. Houwman, W. Siemons, D. H. A. Blank, M. Huijben, G. Koster, A. Vailionis, and G. Rijnders, Phys. Rev. Lett. 109, 157207 (2012). 10.1103/PhysRevLett.109.157207
16. M. Huijben, L. W. Martin, Y. H. Chu, M. B. Holcomb, P. Yu, G. Rijnders, D. H. A. Blank, and R. Ramesh, Phys. Rev. B 78, 094413 (2008). 10.1103/PhysRevB.78.094413
17. L. F. Kourkoutis, J. H. Song, H. Y. Hwang, and D. A. Mullera, Proc. Natl. Acad. Sci. U.S.A. 107, 11682 (2010). 10.1073/pnas.1005693107
18. H. Boschker, J. Verbeeck, R. Egoavil, S. Bals, G. van Tendeloo, M. Huijben, E. P. Houwman, G. Koster, D. H. A. Blank, and G. Rijnders, Adv. Funct. Mater. 22, 2235 (2012). 10.1002/adfm.201102763
19. H. Yamada, Y. Ogawa, Y. Ishii, H. Sato, M. Kawasaki, H. Akoh, and Y. Tokura, Science 305, 646 (2004). 10.1126/science.1098867
20. M. Angeloni, G. Balestrino, N. G. Boggio, P. G. Medaglia, P. Orgiani, and A. Tebano, J. Appl. Phys. 96, 6387 (2004). 10.1063/1.1812599
21. A. Urushibara, Y. Moritomo, T. Arima, A. Asamitsu, G. Kido, and Y. Tokura, Phys. Rev. B 51, 14103 (1995). 10.1103/PhysRevB.51.14103
22. H. Y. Hwang, S. W. Cheong, P. G. Radaelli, M. Marezio, and B. Batlogg, Phys. Rev. Lett. 75, 914 (1995). 10.1103/PhysRevLett.75.914
23. H. Y. Hwang, T. T. M. Palstra, S.-W. Cheong, and B. Batlogg, Phys. Rev. B 52, 15046 (1995). 10.1103/PhysRevB.52.15046
24. C. Wang, N. Stojic, and N. Binggeli, Appl. Phys. Lett. 102, 152414 (2013). 10.1063/1.4802732
25. J. Son, P. Moetakef, B. Jalan, O. Bierwagen, N. J. Wright, R. Engel-Herbert, and S. Stemmer, Nature Mater. 9, 482 (2010). 10.1038/nmat2750
26. G. Logvenov, A. Gozar, and I. Bozovic, Science 326, 699 (2009). 10.1126/science.1178863
27. J. H. Haeni, C. D. Theis, and D. G. Schlom, J. Electroceram. 4, 385 (2000). 10.1023/A:1009947517710
28. A. Segmüller, Thin Solid Films 18, 287 (1973). 10.1016/0040-6090(73) 90107-7
29. See supplementary material at http://dx.doi.org/10.1063/1.4866461 E-APPLAB-104-076408 for the calibration of relative stoichiometry, the calibration of thickness for LSMO growth, characterizations of film quality and strain effect, and electrostatic analysis for various engineered dopings.
30. H. Boschker, M. Huijben, A. Vailionis, J. Verbeeck, S. Aert, M. Luysberg, S. Bals, G. Tendeloo, E. Houwman, G. Koster, D. Blank, and G. Rijnders, J. Phys. D: Appl. Phys. 44, 205001 (2011). 10.1088/0022-3727/44/20/205001
31. C. Adamo, X. Ke, H. Q. Wang, H. L. Xin, T. Heeg, M. E. Hawley, W. Zander, J. Schubert, P. Schiffer, D. A. Muller, L. Maritato, and D. G. Schlom, Appl. Phys. Lett. 95, 112504 (2009). 10.1063/1.3213346
32. A. J. Millisa, T. Darling, and A. Migliori, J. Appl. Phys. 83, 1588 (1998). 10.1063/1.367310
33. S. Picozzi, C. Ma, Z. Yang, R. Bertacco, M. Cantoni, A. Cattoni, D. Petti, S. Brivio, and F. Ciccacci, Phys. Rev. B 75, 094418 (2007). 10.1103/PhysRevB.75.094418
34. C. Schlueter, P. Orgiani, T. L. Lee, A. Y. Petrov, A. Galdi, B. A. Davidson, J. Zegenhagen, and C. Aruta, Phys. Rev. B 86, 155102 (2012). 10.1103/PhysRevB.86.155102
35. A. Vailionis, H. Boschker, W. Siemons, E. P. Houwman, D. H. A. Blank, G. Rijnders, and G. Koster, Phys. Rev. B 83, 064101 (2011). 10.1103/PhysRevB.83. 064101
36. F. Sandiumenge, J. Santiso, L. Balcells, Z. Konstantinovic, J. Roqueta, A. Pomar, J. P. Espinós, and B. Martínez, Phys. Rev. Lett. 110, 107206 (2013). 10.1103/PhysRevLett.110.107206
37. N. Nakagama, H. Y. Hwang, and D. A. Muller, Nature Mater. 5, 204 (2006). 10.1038/nmat1569
38. J. Liu, M. Kareev, S. Prosandeev, B. Gray, P. Ryan, J. W. Freeland, and J. Chakhalian, Appl. Phys. Lett. 96, 133111 (2010). 10.1063/1.3371690
39. Y. Hikita, M. Nishikawa, T. Yajima, and H. Y. Hwang, Phys. Rev. B 79, 073101 (2009). 10.1103/PhysRevB.79.073101
40. M. Minohara, R. Yasuhara, H. Kumigashira, and M. Oshima, Phys. Rev. B 81, 235322 (2010). 10.1103/PhysRevB.81.235322
41. H. Kumigashira, A. Chikamatsu, R. Hashimoto, M. Oshima, T. Ohnishi, M. Lippmaa, H. Wadati, A. Fujimori, K. Ono, M. Kawasaki, and H. Koinuma, Appl. Phys. Lett. 88, 192504 (2006). 10.1063/1.2202118