Suppression of the metal-insulator transition temperature in thin La 0.7Sr0.3MnO3 films

Journal of Applied Physics

Volumn 96, Issue 11, 2004, Pages 6387-6392

  Angeloni, M ^a   Balestrino, G ^a   Boggio, N G ^a   Medaglia, P G ^a   Orgiani, P ^a   Tebano, A ^a  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; MIS DEVICES; PULSED LASER DEPOSITION; STOICHIOMETRY; STRAIN MEASUREMENT; SUPERCONDUCTING TRANSITION TEMPERATURE; THICKNESS MEASUREMENT; THIN FILMS;

BIAXIAL STRAINS; ELECTRICAL CONDUCTION; EPITAXIAL STRAINS; INSULATING BEHAVIOR;

LANTHANUM COMPOUNDS;

EID: 16244411576     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1812599     Document Type: Article

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