Robust Ti4+ states in SrTiO3 layers of La 0.6Sr0.4MnO3/SrTiO3/La 0.6Sr0.4MnO3 junctions

Applied Physics Letters

Volumn 88, Issue 19, 2006, Pages

  Kumigashira, H ^a   Chikamatsu, A ^a   Hashimoto, R ^a   Oshima, M ^a   Ohnishi, T ^a   Lippmaa, M ^a   Wadati, H ^a   Fujimori, A ^a   Ono, K ^b   Kawasaki, M ^c   Koinuma, H ^d  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRONIC STRUCTURE; LANTHANUM COMPOUNDS; PHOTOEMISSION; SPECTROSCOPIC ANALYSIS; STRONTIUM COMPOUNDS;

CHEMICAL CARRIER CONCENTRATION; INTERFACIAL ELECTRONIC STRUCTURE; PHOTOEMISSION SPECTROSCOPY; TETRAVALENT STATES;

SEMICONDUCTOR JUNCTIONS;

EID: 33646694971     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2202118     Document Type: Article

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