Microstructure and Raman scattering of Ag-doping ZnO films deposited on buffer layers

Journal of Crystal Growth

Volumn 394, Issue , 2014, Pages 132-136

  Bian, H Q ^a   Ma, S Y ^a   Zhang, Z M ^a   Gao, J M ^a   Zhu, H B ^a  

^a NORTHWEST NORMAL UNIVERSITY   (China)

Author keywords

A1. Optical band gap; A1. Raman spectroscopy; A1. RF magnetron sputtering; A1. X ray diffraction; B1. ZnO films

Indexed keywords

BUFFER LAYERS; CRYSTALLIZATION; MAGNETRON SPUTTERING; METALLIC FILMS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

CRYSTALLIZATION BEHAVIOR; LOCAL VIBRATIONAL MODE; PREFERRED ORIENTATIONS; RADIO FREQUENCY REACTIVE MAGNETRON SPUTTERING; RF-MAGNETRON SPUTTERING; UNIFORM GRAIN SIZE; ZNO BUFFER LAYER; ZNO FILMS;

SILVER;

EID: 84896456306     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2014.02.036     Document Type: Article

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