Measuring the three-dimensional structure of ultrathin insulating films at the atomic scale

ACS Nano

Volumn 8, Issue 2, 2014, Pages 1739-1744

  Baumann, Susanne ^a,b   Rau, Ileana G ^a   Loth, Sebastian ^c,d   Lutz, Christopher P ^a   Heinrich, Andreas J ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b UNIVERSITY OF BASEL   (Switzerland)

^c MAX PLANCK INSTITUTE FOR THE STRUCTURE AND DYNAMICS OF MATTER   (Germany)

^d MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

atomic force microscopy; conductive AFM; magnesium oxide; scanning tunneling microscopy; thickness determination; thin insulating films; thin oxide films

Indexed keywords

EID: 84894627746     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn4061034     Document Type: Article

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