Scanning tunneling microscopy imaging of NiO(100)(1 × 1) islands embedded in Ag(100)

Surface Science

Volumn 606, Issue 9-10, 2012, Pages 803-807

  Steurer, Wolfram ^a   Surnev, Svetlozar ^a   Fortunelli, Alessandro ^b   Netzer, Falko P ^a  

^a UNIVERSITY OF GRAZ   (Austria)

^b AREA DELLA RICERCA   (Italy)

Author keywords

Scanning tunneling microscopy; Ultrathin oxide surfaces

Indexed keywords

AG SUBSTRATE; AG(100); BI-LAYER; DEFECT-FREE SURFACES; DENSITY OF STATE; OXIDE ISLANDS; OXIDE LAYER; SECOND LAYER; STACKINGS; SUBMONOLAYER COVERAGE; ULTRATHIN OXIDE SURFACES; VACUUM INTERFACES;

MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILVER; VACUUM;

INTERFACES (MATERIALS);

EID: 84858342227     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2012.01.012     Document Type: Article

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