Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging

Optics Express

Volumn 22, Issue 3, 2014, Pages 3432-3438

  Rajshekhar, Gannavarpu ^a   Bhaduri, Basanta ^a   Edwards, Chris ^a   Zhou, Renjie ^a   Goddard, Lynford L ^a   Popescu, Gabriel ^a  

^a United States of America   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLE;

CHEMISTRY; DEVICES; INTERFEROMETRY; LIQUID CRYSTAL; MATERIALS TESTING; PROCEDURES; REFRACTOMETRY; SURFACE PROPERTY; ULTRASTRUCTURE;

INTERFEROMETRY; LIQUID CRYSTALS; MATERIALS TESTING; NANOPARTICLES; REFRACTOMETRY; SURFACE PROPERTIES;

EID: 84893953709     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.003432     Document Type: Article

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