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Volumn 52, Issue 1, 2013, Pages 1-8

Computerized interferometric surface measurements [Invited]

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES; PHASE SHIFT; SURFACE MEASUREMENT; SURFACE ROUGHNESS; VIBRATION ANALYSIS;

EID: 84871949574     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.000001     Document Type: Conference Paper
Times cited : (72)

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