-
1
-
-
84975539373
-
New developments in interferometry
-
H. D. Polster, J. Pastor, R. M. Scott, R. Crane, P. H. Langenbeck, R. Pilston, and G. Steinberg, "New developments in interferometry," Appl. Opt. 8, 521-556 (1969).
-
(1969)
Appl. Opt.
, vol.8
, pp. 521-556
-
-
Polster, H.D.1
Pastor, J.2
Scott, R.M.3
Crane, R.4
Langenbeck, P.H.5
Pilston, R.6
Steinberg, G.7
-
3
-
-
0015027523
-
Computer generated holograms for testing optical elements
-
A. J. MacGovern and J. C. Wyant, "Computer generated holograms for testing optical elements," Appl. Opt. 10, 619-624 (1971).
-
(1971)
Appl. Opt.
, vol.10
, pp. 619-624
-
-
MacGovern, A.J.1
Wyant, J.C.2
-
4
-
-
0015476481
-
Using computer generated holograms to test aspheric wavefronts
-
J. C. Wyant and V. P. Bennett, "Using computer generated holograms to test aspheric wavefronts," Appl. Opt. 11, 2833-2839 (1972).
-
(1972)
Appl. Opt.
, vol.11
, pp. 2833-2839
-
-
Wyant, J.C.1
Bennett, V.P.2
-
5
-
-
78149441227
-
Testing of aspheric wavefronts and surfaces
-
D. Malacara, ed. Wiley
-
D. Malacara, K. Creath, J. Schmit, and J. C.Wyant, "Testing of aspheric wavefronts and surfaces," in Optical Shop Testing, D. Malacara, ed. (Wiley, 2007), pp. 477-488.
-
(2007)
Optical Shop Testing
, pp. 477-488
-
-
Malacara, D.1
Creath, K.2
Schmit, J.3
Wyant, J.C.4
-
6
-
-
0022256123
-
Testing aspheric surfaces with computer generated holograms: Analysis of adjustment and shape errors
-
B. Dorband and H. J. Tiziani, "Testing aspheric surfaces with computer generated holograms: analysis of adjustment and shape errors," Appl. Opt. 24, 2604-2611 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 2604-2611
-
-
Dorband, B.1
Tiziani, H.J.2
-
7
-
-
0003350049
-
Interferometric tests for aspherics
-
M. Taylor, M Piscotty, and A. Lindquist, eds., 24 of OSA Trends in Optics and Photonics (Optical Society of America
-
J. Schwider, "Interferometric tests for aspherics," in Fabrication and Testing of Aspheres, M. Taylor, M Piscotty, and A. Lindquist, eds., Vol. 24 of OSA Trends in Optics and Photonics (Optical Society of America, 1999), paper T3.
-
(1999)
Fabrication and Testing of Aspheres
-
-
Schwider, J.1
-
8
-
-
11244319492
-
Computergenerated holograms in interferometric testing
-
C. Pruss, S. Reichelt, H. J. Tiziani, and W. Olsen, " Computergenerated holograms in interferometric testing," Opt. Eng. 43, 2534-2540 (2004).
-
(2004)
Opt. Eng.
, vol.43
, pp. 2534-2540
-
-
Pruss, C.1
Reichelt, S.2
Tiziani, H.J.3
Olsen, W.4
-
9
-
-
33947095557
-
Fabrication error analysis and experimental demonstration for computer-generated holograms
-
P. Zhou and J. H. Burge, "Fabrication error analysis and experimental demonstration for computer-generated holograms," Appl. Opt. 46, 657-663 (2007).
-
(2007)
Appl. Opt.
, vol.46
, pp. 657-663
-
-
Zhou, P.1
Burge, J.H.2
-
10
-
-
0000684770
-
Computer-generated holograms for testing optical elements: Error analysis and error compensation
-
A. F. Fercher, "Computer-generated holograms for testing optical elements: error analysis and error compensation," Opt. Acta 23, 347-365 (1976).
-
(1976)
Opt. Acta
, vol.23
, pp. 347-365
-
-
Fercher, A.F.1
-
11
-
-
0020843139
-
Plotting errors measurement of CGH using an improved interferometric method
-
A. Ono and J. C.Wyant, "Plotting errors measurement of CGH using an improved interferometric method," Appl. Opt. 23, 3905-3910 (1984).
-
(1984)
Appl. Opt.
, vol.23
, pp. 3905-3910
-
-
Ono, A.1
Wyant, J.C.2
-
12
-
-
84975645870
-
Aspherical mirror testing using a CGH with small errors
-
A. Ono and J. C. Wyant, "Aspherical mirror testing using a CGH with small errors," Appl. Opt. 24, 560-563 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 560-563
-
-
Ono, A.1
Wyant, J.C.2
-
13
-
-
84975558669
-
Interferometric method of measuring plotter distortion
-
J. C. Wyant, P. K. O'Neill, and A. J. MacGovern, "Interferometric method of measuring plotter distortion," Appl. Opt. 13, 1549-1551 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 1549-1551
-
-
Wyant, J.C.1
O'Neill, P.K.2
MacGovern, A.J.3
-
14
-
-
0036576059
-
Dual-wave-front computer-generated holograms for quasi-absolute testing of aspherics
-
M. Beyerlein, N. Lindlein, and J. Schwider, "Dual-wave-front computer-generated holograms for quasi-absolute testing of aspherics," Appl. Opt. 41, 2440-2447 (2002).
-
(2002)
Appl. Opt.
, vol.41
, pp. 2440-2447
-
-
Beyerlein, M.1
Lindlein, N.2
Schwider, J.3
-
15
-
-
0041379901
-
Absolute interferometric test of aspheres by use of twin computer-generated holograms
-
S. Reichelt, C. Pruss, and H. J. Tiziani, "Absolute interferometric test of aspheres by use of twin computer-generated holograms," Appl. Opt. 42, 4468-4479 (2003).
-
(2003)
Appl. Opt.
, vol.42
, pp. 4468-4479
-
-
Reichelt, S.1
Pruss, C.2
Tiziani, H.J.3
-
16
-
-
0029490946
-
Verification and certification of CGH aspheric nulls
-
S. M. Arnold and R. Kestner, "Verification and certification of CGH aspheric nulls," Proc. SPIE 2536, 117-126 (1995).
-
(1995)
Proc. SPIE
, vol.2536
, pp. 117-126
-
-
Arnold, S.M.1
Kestner, R.2
-
17
-
-
0033315573
-
Error analysis for CGH optical testing
-
Y.-C. Chang and J. H. Burge, "Error analysis for CGH optical testing," Proc. SPIE 3782, 358-366 (1999).
-
(1999)
Proc. SPIE
, vol.3782
, pp. 358-366
-
-
Chang, Y.-C.1
Burge, J.H.2
-
18
-
-
84975542815
-
Computer generated hologram: Null lens test of aspheric wavefronts
-
J. C.Wyant and P. K. O'Neill, "Computer generated hologram: null lens test of aspheric wavefronts," Appl. Opt. 13, 2762-2765 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 2762-2765
-
-
Wyant, J.C.1
O'Neill, P.K.2
-
19
-
-
0002834304
-
"installation et utilisation du comparateur photoelectrigue et Interferentiel du Bureau International de Poids ek Measures
-
P. Carré, "Installation et utilisation du comparateur photoelectrigue et Interferentiel du Bureau International de Poids ek Measures," Metrologia 2, 13-23 (1966).
-
(1966)
Metrologia
, vol.2
, pp. 13-23
-
-
Carré, P.1
-
20
-
-
0001762831
-
Interference phase measurement
-
R. Crane, "Interference phase measurement," Appl. Opt. 8, 538-542 (1969).
-
(1969)
Appl. Opt.
, vol.8
, pp. 538-542
-
-
Crane, R.1
-
21
-
-
0015667872
-
Double frequency grating lateral shear interferometer
-
J. C. Wyant, "Double frequency grating lateral shear interferometer," Appl. Opt. 12, 2057-2060 (1973).
-
(1973)
Appl. Opt.
, vol.12
, pp. 2057-2060
-
-
Wyant, J.C.1
-
22
-
-
0016128770
-
Digital wavefront measuring interferometer for testing optical surfaces and lenses
-
J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio, "Digital wavefront measuring interferometer for testing optical surfaces and lenses," Appl. Opt. 13, 2693-2703 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 2693-2703
-
-
Bruning, J.H.1
Herriott, D.R.2
Gallagher, J.E.3
Rosenfeld, D.P.4
White, A.D.5
Brangaccio, D.J.6
-
23
-
-
0016577701
-
Use of an ac heterodyne lateral shear interferometer with real-time wavefront correction systems
-
J. C. Wyant, "Use of an ac heterodyne lateral shear interferometer with real-time wavefront correction systems," Appl. Opt. 14, 2622-2626 (1975).
-
(1975)
Appl. Opt.
, vol.14
, pp. 2622-2626
-
-
Wyant, J.C.1
-
24
-
-
0020844269
-
Digital wave-front measuring interferometry: Some systematic error sources
-
J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel, "Digital wave-front measuring interferometry: some systematic error sources," Appl. Opt. 22, 3421-3432 (1983).
-
(1983)
Appl. Opt.
, vol.22
, pp. 3421-3432
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Grzanna, J.4
Spolaczyk, R.5
Merkel, K.6
-
25
-
-
84871967799
-
Real time phase correction of optical imaging systems
-
presented at, Boulder, Colorado, 9-11 July
-
J.W. Hardy, J. Feinleib, and J. C.Wyant, "Real time phase correction of optical imaging systems," presented at OSA Topical Meeting on Optical Propagation through Turbulence, Boulder, Colorado, 9-11 July 1974.
-
(1974)
OSA Topical Meeting on Optical Propagation Through Turbulence
-
-
Hardy, J.W.1
Feinleib, J.2
Wyant, J.C.3
-
26
-
-
0021815465
-
Measurement of surface topography of magnetic tapes by Mirau interferometry
-
B. Bhushan, J. C. Wyant, and C. L. Koliopoulos, "Measurement of surface topography of magnetic tapes by Mirau interferometry," Appl. Opt. 24, 1489-1497 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 1489-1497
-
-
Bhushan, B.1
Wyant, J.C.2
Koliopoulos, C.L.3
-
27
-
-
0010236556
-
Optical profilers for surface roughness
-
J. C. Wyant, "Optical profilers for surface roughness," Proc. SPIE 525, 174-180 (1985).
-
(1985)
Proc. SPIE
, vol.525
, pp. 174-180
-
-
Wyant, J.C.1
-
28
-
-
0026810040
-
Advances in interferometric optical profiling
-
J. C. Wyant and K. Creath, "Advances in interferometric optical profiling," Int. J. Mach. Tools Manufact. 32, 5-10 (1992).
-
(1992)
Int. J. Mach. Tools Manufact.
, vol.32
, pp. 5-10
-
-
Wyant, J.C.1
Creath, K.2
-
30
-
-
84925486651
-
Two-wavelength phase shifting interferometry
-
Y.-Y. Cheng and J. C. Wyant, "Two-wavelength phase shifting interferometry," Appl. Opt. 23, 4539-4543 (1984).
-
(1984)
Appl. Opt.
, vol.23
, pp. 4539-4543
-
-
Cheng, Y.-Y.1
Wyant, J.C.2
-
31
-
-
0022001763
-
Multiple-wavelength phaseshifting interferometry
-
Y.-Y. Cheng and J. C. Wyant, "Multiple-wavelength phaseshifting interferometry," Appl. Opt. 24, 804-807 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 804-807
-
-
Cheng, Y.-Y.1
Wyant, J.C.2
-
32
-
-
84957477993
-
An application of interference microscopy to integrated circuit inspection and metrology
-
M. Davidson, K. Kaufman, I. Mazor, and F. Cohen, "An application of interference microscopy to integrated circuit inspection and metrology," Proc. SPIE 775, 233-247 (1987).
-
(1987)
Proc. SPIE
, vol.775
, pp. 233-247
-
-
Davidson, M.1
Kaufman, K.2
Mazor, I.3
Cohen, F.4
-
33
-
-
84975646278
-
Three-dimensional sensing of rough surfaces by coherence radar
-
T. Dresel, G. Hausler, and H. Venzke, "Three-dimensional sensing of rough surfaces by coherence radar," Appl. Opt. 31, 919-925 (1992).
-
(1992)
Appl. Opt.
, vol.31
, pp. 919-925
-
-
Dresel, T.1
Hausler, G.2
Venzke, H.3
-
34
-
-
0027639146
-
An interferometric profiler for rough surfaces
-
P. J. Caber, "An interferometric profiler for rough surfaces," Appl. Opt. 32, 3438-3441 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 3438-3441
-
-
Caber, P.J.1
-
35
-
-
38849169917
-
Surface measurement errors using commercial scanning white light interferometers
-
F. Gao, R. K. Leach, J. Petzing, and J. M. Coupland, "Surface measurement errors using commercial scanning white light interferometers," Meas. Sci. Technol. 19, 015303 (2008).
-
(2008)
Meas. Sci. Technol.
, vol.19
, pp. 015303
-
-
Gao, F.1
Leach, R.K.2
Petzing, J.3
Coupland, J.M.4
-
36
-
-
84862291656
-
Advances in calibration methods for micro- and nanoscale surfaces
-
R. K. Leach, C. L. Giusca, and J. M. Coupland, "Advances in calibration methods for micro- and nanoscale surfaces," Proc. SPIE 8430, 84300H (2012).
-
(2012)
Proc. SPIE
, vol.8430
-
-
Leach, R.K.1
Giusca, C.L.2
Coupland, J.M.3
-
37
-
-
0019927495
-
Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
-
M. Takeda, H. Ina, and S. Kabayashi, "Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry," J. Opt. Soc. Am. 72, 156-160 (1982).
-
(1982)
J. Opt. Soc. Am.
, vol.72
, pp. 156-160
-
-
Takeda, M.1
Ina, H.2
Kabayashi, S.3
-
38
-
-
0020869611
-
Interferometric phase measurement using spatial synchronous detection
-
K. H. Womack, "Interferometric phase measurement using spatial synchronous detection," Proc. SPIE 429, 8-15 (1983).
-
(1983)
Proc. SPIE
, vol.429
, pp. 8-15
-
-
Womack, K.H.1
-
39
-
-
0021374417
-
Multichannel phase shifted interferometer
-
O. Y. Kwon, "Multichannel phase shifted interferometer," Opt. Lett. 9, 59-61 (1984).
-
(1984)
Opt. Lett.
, vol.9
, pp. 59-61
-
-
Kwon, O.Y.1
-
40
-
-
85075532639
-
Simultaneous phase-shift interferometer
-
C. L. Koliopoulos, "Simultaneous phase-shift interferometer," Proc. SPIE 1531, 119-128 (1991).
-
(1991)
Proc. SPIE
, vol.1531
, pp. 119-128
-
-
Koliopoulos, C.L.1
-
41
-
-
0001492036
-
Frequency-multiplex Fourier-transform profilometry: A single shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations
-
M. Takeda, Q. Gu, M. Kinoshita, H. Takai, and Y. Takahashi, "Frequency-multiplex Fourier-transform profilometry: a single shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations," Appl. Opt. 36, 5347-5354 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 5347-5354
-
-
Takeda, M.1
Gu, Q.2
Kinoshita, M.3
Takai, H.4
Takahashi, Y.5
-
42
-
-
15744395809
-
Pixelated phase-mask dynamic interferometer
-
J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak, and J. C. Wyant, "Pixelated phase-mask dynamic interferometer," Proc. SPIE 5531, 304-314 (2004).
-
(2004)
Proc. SPIE
, vol.5531
, pp. 304-314
-
-
Millerd, J.1
Brock, N.2
Hayes, J.3
North-Morris, M.4
Novak, M.5
Wyant, J.C.6
-
43
-
-
15744401129
-
Instantaneous phase-shift, point-diffraction interferometer
-
J. E. Millerd, N. J. Brock, J. B. Hayes, and J. C. Wyant, "Instantaneous phase-shift, point-diffraction interferometer," Proc. SPIE 5531, 264-272 (2004).
-
(2004)
Proc. SPIE
, vol.5531
, pp. 264-272
-
-
Millerd, J.E.1
Brock, N.J.2
Hayes, J.B.3
Wyant, J.C.4
-
44
-
-
27944454812
-
Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer
-
M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. C. Wyant, "Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer," Appl. Opt. 44, 6861-6868 (2005).
-
(2005)
Appl. Opt.
, vol.44
, pp. 6861-6868
-
-
Novak, M.1
Millerd, J.2
Brock, N.3
North-Morris, M.4
Hayes, J.5
Wyant, J.C.6
-
45
-
-
29144449834
-
Dynamic interferometry
-
N. Brock, J. Hayes, B. Kimbrough, J. Millerd, M. North-Morris, M. Novak, and J. C.Wyant, "Dynamic interferometry," Proc. SPIE 5875, 58750F (2005).
-
(2005)
Proc. SPIE
, vol.5875
-
-
Brock, N.1
Hayes, J.2
Kimbrough, B.3
Millerd, J.4
North-Morris, M.5
Novak, M.6
Wyant, J.C.7
-
46
-
-
0345320930
-
Achromatic phase-shifting by a rotating polarizer
-
S. Suja Helen, M. P. Kothiyal, and R. S. Sirohi, "Achromatic phase-shifting by a rotating polarizer," Opt. Commun. 154, 249-254 (1998).
-
(1998)
Opt. Commun.
, vol.154
, pp. 249-254
-
-
Suja Helen, S.1
Kothiyal, M.P.2
Sirohi, R.S.3
-
47
-
-
78649920671
-
The spatial frequency response and resolution limitations of pixelated mask spatial carrier based phase shifting interferometry
-
B. Kimbrough and J. Millerd, "The spatial frequency response and resolution limitations of pixelated mask spatial carrier based phase shifting interferometry," Proc. SPIE 7790, 77900K (2010).
-
(2010)
Proc. SPIE
, vol.7790
-
-
Kimbrough, B.1
Millerd, J.2
-
48
-
-
81855228699
-
Instantaneous measurement Fizeau interferometer with high spatial resolution
-
D. M. Sykora and P. de Groot, "Instantaneous measurement Fizeau interferometer with high spatial resolution," Proc. SPIE 8126, 812610 (2011).
-
(2011)
Proc. SPIE
, vol.8126
, pp. 812610
-
-
Sykora, D.M.1
De Groot, P.2
-
49
-
-
33749677856
-
Low coherence vibration insensitive Fizeau interferometer
-
B. Kimbrough, J. Millerd, J. Wyant, and J. Hayes, "Low coherence vibration insensitive Fizeau interferometer," Proc. SPIE 6292, 62920F (2006).
-
(2006)
Proc. SPIE
, vol.6292
-
-
Kimbrough, B.1
Millerd, J.2
Wyant, J.3
Hayes, J.4
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