Surface metrology

Measurement Science and Technology

Volumn 8, Issue 9, 1997, Pages 955-972

  Whitehouse, D J ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SURFACE PROPERTIES;

NANOMETROLOGY;

SURFACE MEASUREMENT;

EID: 0031235090     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/8/9/002     Document Type: Review

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