Hilbert phase microscopy for investigating fast dynamics in transparent systems

Optics Letters

Volumn 30, Issue 10, 2005, Pages 1165-1167

  Ikeda, Takahiro ^a   Popescu, Gabriel ^b   Dasari, Ramachandra R ^b   Feld, Michael S ^b  

^a CENTRAL RESEARCH LABORATORY   (Japan)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACQUISITION RATE; HILBERT TRANSFORM; PHASE-RECONSTRUCTION ALGORITHM; TRANSMISSION-INTENSITY IMAGES;

CELLS; CHARGE COUPLED DEVICES; FOURIER TRANSFORMS; HIGH PASS FILTERS; IMAGE PROCESSING; TRANSPARENCY;

OPTICAL MICROSCOPY;

ARTICLE; COMPUTER SYSTEM; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; FEASIBILITY STUDY; IMAGE ENHANCEMENT; IMAGE QUALITY; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; PHASE CONTRAST MICROSCOPY;

COMPUTER SYSTEMS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FEASIBILITY STUDIES; IMAGE ENHANCEMENT; MICROSCOPY, INTERFERENCE; MICROSCOPY, PHASE-CONTRAST; MICROSCOPY, VIDEO; PHANTOMS, IMAGING;

EID: 20444410067     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.001165     Document Type: Article

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