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Volumn 90, Issue 6, 2003, Pages 4-
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Direct Determination of Strain and Composition Profiles in SiGe Islands by Anomalous X-Ray Diffraction at High Momentum Transfer
a,b a a a b b a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84892912780
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.90.066105 Document Type: Article |
Times cited : (3)
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References (18)
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