Size distribution and electroluminescence of self-assembled Ge dots

Journal of Applied Physics

Volumn 87, Issue 10, 2000, Pages 7275-7282

  Vescan, L ^a   Stoica, T ^a,b   Chretien, O ^a   Goryll, M ^a   Mateeva, E ^a,c   Muck A ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^c Department of Geology and Geological Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000994238     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372980     Document Type: Article

References (35)

1. J. C. Campbell, in Germanium Silicon: Physics and Materials: Optoelectronics in Silicon and Germanium Silicon, edited by R. Hull and J. C. Bean (Academic, San Diego, 1999) p. 347.
2. R. Apetz, L. Vescan, C. Dicker, and H. Lüth, Appl. Phys. Lett. 66, 445 (1995).
3. L. Vescan, M. Goryll, K. Grimm, C. Dicker, IEEE Topical Meeting on Silicon Integrated Circuits for RF Systems. Ann Arbor, MI, February, 1998, p. 38.
4. L. Vescan and T. Stoica, in Silicon Based Optoelectronics, edited by D. C. Houghton and E. A. Fitzgerald (SPIE, Bellingham, 1999), Vol. 3630, p. 163.
5. T. Stoica and L. Vescan, J. Appl. Phys. 83, 3367 (1998).
6. E. Mateeva, P. Sutter, J. C. Bean, and M. G. Lagally, Appl. Phys. Lett. 71, 3233 (1997).
7. L. Vescan, W. Jäger, C. Dicker, K. Schmidt, H. Lüth, in Mechanism of Heteroepilaxial Growth, edited by M. F. Chrishom, R. Hull, and L. J. Schowalter (MRS Symposia, Pittsburgh, PA, 1992), Vol. 263, p. 23.
8. V. LeThanh, V. Yam, P. Boucaud, F. Fortuna, C. Ulysse, D. Bouchier, L. Vervoort, and J.-M. Lourtioz, Phys. Rev. B 60, 5851 (1999).
9. L. Vescan, J. Cryst. Growth 194, 173 (1998).
10. L. Vescan, K. Grimm, M. Goryll, and B. Holländer, Mater. Sci. Eng., B 69-70, 324 (1999).
11. L. Vescan, C. Dicker, A. Hartmann, and A. van der Hart, Semicond. Sci. Technol. 9, 387 (1994).
12. L. Vescan, K. Grimm, and C. Dicker, J. Vac. Sci. Technol. B 16, 1549 (1998).
13. C. Popescu, R. Apetz, and L. Vescan, J. Appl. Phys. 80, 5791 (1996).
14. M. Goryll, L. Vescan, K. Schmidt, K. Szot, S. Mesters, and H. Lüth, Appl. Phys. Lett. 71, 410 (1997).
15. M. Goryll, L. Vescan, and H. Lüth, Thin Solid Films 336, 244 (1998).
16. M. Goryll, L. Vescan, and H. Lüth, in Epitaxial Growth - Principles and Applications, edited by A.-L. Barabasi, M. Krishnamutthy, F. Liu, and T. Pearsall (MRS Symposia, Pittsburgh, PA, 1989), Vol. 570, p. 205.
17. Y.-W. Mo, D. E. Savage, B. S. Swartzenhuber, and M. G. Lagally, Phys. Rev. Lett. 65, 1020 (1990).
18. D. J. Eaglesham and M. Cerullo, Phys. Rev. Lett. 64, 1943 (1990).
19. M. Zinke-Allmang, L. C. Feldman, and M. H. Grabow, Surf. Sci. Rep. 16, 377 (1992).
20. M. Tomitori, K. Watanabe, M. Kobayashi, and O. Nishikawa, Appl. Surf. Sci. 76/77, 322 (1994).
21. G. Capellini, L. Di Caspare, F. Evangelisti, and E. Palange, Appl. Phys. Lett. 70, 493 (1996).
22. T. I. Kamins, E. C. Carr, R. S. Williams, and S. J. Rosner, J. Appl. Phys. 81, 211 (1997).
23. G. Medeiros-Ribeiro, A. M. Bratkovski, T. I. Kamins, D. A. A. Ohlberg, and R. S. Williams, Science 279, 353 (1998).
24. J. H. Zhu, K. Brunner, and G. Abstreiter, Appl. Phys. Lett. 72, 424 (1998).
25. B. Rahmati, W. Jäger, H. Trinkhaus, R. Loo, and H. Lüth, Appl. Phys. A: Mater. Sci. Process. 62, 575 (1996).
26. L. Kubler, D. Dentel, J. L. Bischoff, C. Ghica, C. Ulhaq-Bouillet, and J. Werckmann, Appl. Phys. Lett. 73, 1053 (1998).
27. P. Sutter and M. G. Lagally, Phys. Rev. Lett. 81, 3471 (1998).
28. R. Braunstein, A. R. Moor, and F. Herman. Phys. Rev. 109, 695 (1958).
29. S. Christiansen, M. Albrecht, and H. P. Strunk, Comput. Mater. Sci. 7, 213 (1996).
30. A. J. Steinfort, P. M. L. O. Scholte, A. Ettema, F. Tuinstra, M. Nielsen, E. Landemark, D.-M. Smilgies, R. Feidenhans, G. Falkenberg, L. Seehofer, and R. L. Johnson, Phys. Rev. Lett. 77, 2009 (1996).
31. P. D. Miller, C.-P. Liu, W. L. Henstrom, J. M. Gibson, Y. Huang, P. Zhang, T. I. Kamins, D. P. Basile, and R. S. Williams, Appl. Phys. Lett. 75, 46 (1999).
32. J. Tersoff and F. K. LeGoues, Phys. Rev. Lett. 72, 3570 (1994).
33. D. Cherns, A. Hovsepian, and W. Jäger, J. Electron Microsc. 47, 211 (1998).
34. P. Gartner (unpublished).
35. M. Franz, K. Pressel, A. Barz, P. Dold, and K. W. Benz, J. Vac. Sci. Technol. B 16, 1717 (1998).