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Journal of Raman Spectroscopy

Volumn 45, Issue 1, 2014, Pages 15-21

Enhancement of lattice defect signatures in graphene and ultrathin graphite using tip-enhanced Raman spectroscopy

(2) Rickman, R H a Dunstan, P R a

a SWANSEA UNIVERSITY (United Kingdom)

Author keywords

defects; graphene; TERS; tip enhanced Raman spectroscopy

Indexed keywords

DEFECTS; ELECTRONIC PROPERTIES; GRAPHENE DEVICES; GRAPHITE; RAMAN SPECTROSCOPY;

DEFECT SENSITIVITY; EDGE REGION; GRAPHENE EDGES; LOCAL PROPERTY; OVERLAPPING REGIONS; PROPERTY; STRUCTURAL INFORMATION; TIP-ENHANCED RAMAN SPECTROSCOPY; ULTRA-THIN;

GRAPHENE;

EID: 84892532721 PISSN: 03770486 EISSN: 10974555 Source Type: Journal
DOI: 10.1002/jrs.4416 Document Type: Article

Times cited : (31)

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