Reversible Defect in Graphene Investigated by Tip-Enhanced Raman Spectroscopy

Plasmonics

Volumn 7, Issue 3, 2012, Pages 555-561

  Wang, Peijie ^a   Zhang, Duan ^a   Li, Lilin ^a   Li, Zhipeng ^a   Zhang, Lisheng ^a   Fang, Yan ^a  

^a CAPITAL NORMAL UNIVERSITY   (China)

Author keywords

Artificial defect; Graphene; Surface plasmon (SP); Tip enhanced Raman spectroscopy (TERS)

Indexed keywords

EID: 84865492054     PISSN: 15571955     EISSN: 15571963     Source Type: Journal    
DOI: 10.1007/s11468-012-9342-8     Document Type: Article

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