Graphene on Si(111)7×7

Nanotechnology

Volumn 23, Issue 40, 2012, Pages

  Ochedowski, O ^a   Begall, G ^a   Scheuschner, N ^b   El Kharrazi, M ^a   Maultzsch, J ^b   Schleberger, M ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HOLE DENSITIES; KELVIN PROBE MEASUREMENTS; LATERAL SIZES; OPTICAL CONTRAST; P-TYPE DOPING; PREPARATION TECHNIQUE; RAMAN MAPPING; SI (1 1 1); SINGLE CRYSTALLINE SILICON; SINGLE LAYER; SPATIALLY RESOLVED; ULTRAHIGH VACUUM CONDITIONS;

NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY;

GRAPHENE;

EID: 84866546705     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/40/405708     Document Type: Article

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