Reproducible electrochemical etching of silver probes with a radius of curvature of 20 nm for tip-enhanced Raman applications

Applied Physics Letters

Volumn 99, Issue 14, 2011, Pages

  Lloyd, J S ^a   Williams, A ^a   Rickman, R H ^a   McCowen, A ^a   Dunstan, P R ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL ETCH; FIELD ENHANCEMENT; OPTIMISATIONS; RADIUS OF CURVATURE; SIGNAL ENHANCEMENT; SILVER PROBE; TIP-ENHANCED RAMAN SPECTROSCOPY;

BOUNDARY ELEMENT METHOD; ETCHING; ETHANOL; NITRIC ACID; OPTIMIZATION; PROBES; RAMAN SPECTROSCOPY;

SILVER;

EID: 80053942448     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3646106     Document Type: Article

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