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Journal of Raman Spectroscopy

Volumn 40, Issue 10, 2009, Pages 1434-1440

Nano-scale analysis of graphene layers by tip-enhanced near-field Raman spectroscopy

(5) Saito, Yuika a Verma, Prabhat b Masui, Kyoko b Inouye, Yasushi b Kawata, Satoshi b

a OSAKA UNIVERSITY (Japan)

b OSAKA UNIVERSITY (Japan)

Author keywords

Apertureless probe; Graphene; Graphite; Near field; Tip enhanced Raman spectroscopy

Indexed keywords

COMPUTERIZED TOMOGRAPHY; NANOTECHNOLOGY; NONDESTRUCTIVE EXAMINATION; PROBES; RAMAN SPECTROSCOPY; SPECTRUM ANALYSIS;

APERTURELESS PROBES; GRAPHENE LAYERS; NANO SCALE; NEAR FIELD PROBES; NEAR FIELDS; NEAR-FIELD RAMAN SPECTROSCOPY; OPTICAL ANALYSIS; RAMAN BANDS; SCALE ANALYSIS; TIP-ENHANCED RAMAN SPECTROSCOPY;

GRAPHENE;

EID: 70350147148 PISSN: 03770486 EISSN: 10974555 Source Type: Journal
DOI: 10.1002/jrs.2366 Document Type: Article

Times cited : (96)

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